Abstract:
A semiconductor memory device selects one of a plurality of memory cells as a dummy memory cell. The dummy memory cell is connected to a bit line that is complementary to a bit line connected to a selected memory cell. This technique advantageously compensates capacitance of the bit line. The semiconductor memory device comprises a selected memory cell connected to a first bit line and a first word line, a dummy memory cell connected to a second bit line complementary to the first bit line and a second word line, and a sense amplifier connected to the first and second bit lines and configured to read data stored in the selected memory cell by simultaneously enablement of the first and second word lines.
Abstract:
Provided is a semiconductor device which performs a refresh operation by sequentially counting a refresh address including a main word line address, a mat address, and a sub word line address in order of the main word line address, the mat address, and the sub word line address. The semiconductor device includes a control signal generation unit configured to activate, latch, and output a toggle control signal when a delayed refresh signal is inputted at the initial stage, deactivate and output the toggle control signal after additionally counting a redundancy word line address when counting of the main word line address with respect to the mat address is completed, and then activate, latch, and output the toggle control signal when the delayed refresh signal is inputted.
Abstract:
A semiconductor memory apparatus includes a bit line sense amplifier unit and a driving voltage supply unit. The bit line sense amplifier unit senses and amplifies a signal provided from a memory cell using a pull-up driving voltage provided through a pull-up power line and a pull-down driving voltage provided through a pull-down power line. The driving voltage supply unit supplies the pull-down driving voltage having a first pull-down driving force during a first amplification period, and supplies the pull-down driving voltage having a second pull-down driving force greater than the first pull-down driving force during a second amplification period after the first amplification period.
Abstract:
A voltage generation circuit of a semiconductor memory apparatus includes a plurality of pumping units configured to provide voltages to an output node; a sensing unit configured to sense a voltage level of the output node and generate a pumping enable signal; an oscillator configured to generate an oscillator signal in response to the pumping enable signal; and a control unit configured to selectively output the oscillator signal to the plurality of pumping units in response to an active signal, a power-up signal and a mode register set signal.
Abstract:
A semiconductor device and a layout method of the same reduce a mismatch in a semiconductor device. The semiconductor device includes a first transistor unit providing a first path of current and a second transistor unit designed in a mirror structure to the first transistor unit and providing a second path of current. The layout of the second transistor unit has a shape identical to the first transistor unit and shifted in a first direction. The layout of the semiconductor device reduces a mismatch of the transistors occurring when masks are combined, and thereby reduces their offset.
Abstract:
A semiconductor integrated circuit includes an internal reference voltage generation unit configured to generate an internal reference voltage; a high voltage generation unit configured to pump an external driving voltage based on the internal reference voltage applied from the internal reference voltage generation unit, and generate a high voltage having a specified level; and a reference voltage transfer unit configured to generate a test reference voltage from a reference voltage in a package test mode to correspond to a change in a driving operation of the external driving voltage applied from outside, and monitor and force the internal reference voltage.