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1.
公开(公告)号:US11435257B2
公开(公告)日:2022-09-06
申请号:US16521989
申请日:2019-07-25
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Pei Cheng Chiu
IPC: G01M3/28 , G01M3/02 , G01M13/00 , G01M13/003 , H01L21/67 , G01M13/005
Abstract: A system and method for cleaning and inspecting ring frames is disclosed here. In one embodiment, a vacuum valve comprising at least one sealing O-ring; and a pressure monitoring tape on a mating surface on a vacuum processing chamber, wherein the pressure monitoring tape is configured to perform a pressure profile mapping between the mating surface on the vacuum processing chamber and a surface of the at least one sealing O-ring on the vacuum valve to determine a closing condition of the vacuum valve.
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2.
公开(公告)号:US12111233B2
公开(公告)日:2024-10-08
申请号:US17881307
申请日:2022-08-04
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Pei Cheng Chiu
IPC: G01M3/28 , G01M3/02 , G01M13/00 , G01M13/003 , G01M13/005 , H01L21/67
CPC classification number: G01M3/2876 , G01M3/02 , G01M13/00 , G01M13/003 , G01M13/005 , H01L21/67017
Abstract: A system and method for cleaning and inspecting ring frames is disclosed here. In one embodiment, a vacuum valve comprising at least one sealing O-ring; and a pressure monitoring tape on a mating surface on a vacuum processing chamber, wherein the pressure monitoring tape is configured to perform a pressure profile mapping between the mating surface on the vacuum processing chamber and a surface of the at least one sealing O-ring on the vacuum valve to determine a closing condition of the vacuum valve.
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