公开(公告)号：US20200098440A1

公开(公告)日：2020-03-26

申请号：US16410308

申请日：2019-05-13

申请人： Taiwan Semiconductor Manufacturing Co., Ltd.

发明人： Harry-Hak-Lay Chuang ,  Tien-Wei Chiang ,  Wen-Chun You ,  Yi-Chieh Chiu ,  Yu-Lin Chen ,  Jian-Cheng Huang ,  Chang-Hung Chen

IPC分类号： G11C17/16 ,  G11C17/18 ,  H01L27/22 ,  H01L43/02 ,  H01L43/12

摘要： Various embodiments of the present application are directed towards a one-time-programmable (OTP) implementation using magnetic junctions. In some embodiments, an array comprises multiple magnetic junctions in multiple columns and multiple rows, and the magnetic junctions comprise a first magnetic junction and a second magnetic junction. The first and second magnetic junctions comprise individual top ferromagnetic elements and individual bottom ferromagnetic elements, and further comprise individual barrier elements between the top and bottom ferromagnetic elements. A first barrier element of the first magnetic junction electrically separates first top and bottom ferromagnetic elements of the first magnetic junction. A second barrier element of the second magnetic junction has undergone breakdown, such that it has defects defining a leakage path between second top and bottom ferromagnetic elements of the second magnetic junction. The broken-down state corresponds to a one-time programmed state and is not susceptible to high-temperature change, even at small sizes.