公开(公告)号：US20130000103A1

公开(公告)日：2013-01-03

申请号：US12044427

申请日：2008-03-07

申请人： Takumi YANAGISAWA ,  Masaru HIROSE ,  Shunji SARUKI

发明人： Takumi YANAGISAWA ,  Masaru HIROSE ,  Shunji SARUKI

IPC分类号： G01R31/02 ,  G11B5/127

CPC分类号： G11B5/127 ,  G01R3/00 ,  G01R15/00 ,  G01R19/00 ,  G11B5/3166 ,  G11B5/3173 ,  G11B5/3196 ,  G11B5/3903 ,  G11B5/455 ,  Y10T29/49004 ,  Y10T29/49032 ,  Y10T29/49036 ,  Y10T29/49037

摘要： The method according to the present invention includes the steps of: sequentially applying a plurality of different voltages to an MR element and sequentially detecting output signals from the MR element; and eliminating the MR element as a defective product when an evaluation value, based on a difference of SN ratios of the output signals from the MR element respectively obtained for each applied voltage, is less than a threshold value, and selecting the MR element as a non-defective product when the evaluation value is greater than or equal to the threshold value.

摘要翻译： 根据本发明的方法包括以下步骤：顺序地将多个不同的电压施加到MR元件并且顺序地检测来自MR元件的输出信号; 并且当基于针对每个施加的电压分别获得的来自MR元件的输出信号的SN比的差异的评估值小于阈值时，将MR元件作为缺陷产品消除，并且将MR元素选择为 当评估值大于或等于阈值时，产生无缺陷产品。