公开(公告)号：US12019098B2

公开(公告)日：2024-06-25

申请号：US16883755

申请日：2020-05-26

Applicant: Tektronix, Inc.

Inventor： Noah Brummer ,  Andy K. Lim ,  Jan P. Peeters Weem

IPC: G01R13/34 ,  G01R13/02 ,  H04L27/233

CPC classification number: G01R13/345 ,  G01R13/0272 ,  H04L27/233

Abstract: An equivalent-time sampling test and measurement instrument for acquiring a repeating pattern signal under test at or near a maximum sampling speed of the test and measurement instrument. The test and measurement instrument includes a first input configured to receive repeating pattern information about a signal under test, a second input configured to receive the signal under test, one or more processors configured to determine an optimized trigger holdoff period that is set based on a minimum trigger holdoff period of a test and measurement instrument, and an acquisition unit configured to acquire a portion of the signal under test every optimized trigger holdoff period.

公开(公告)号：US20240027497A1

公开(公告)日：2024-01-25

申请号：US18353638

申请日：2023-07-17

Applicant: Tektronix, Inc.

Inventor： Andy K. Lim ,  Daniel G. Knierim

IPC: G01R13/02 ,  G06T1/20

CPC classification number: G01R13/0218 ,  G01R13/029 ,  G06T1/20

Abstract: A test and measurement instrument has an acquisition system to receive and digitize a batch of waveforms into a batch of digitized waveforms, a memory configured as a raster plane having rows and columns, a graphics processing unit (GPU) capable of processing multiple threads to rasterize the batch of digitized waveforms to the raster plane to form a batch histogram and to group multiple threads into groups of a first type of group, assign each thread group of the first type of group to one column in the raster plane, execute a common instruction per thread group of the first type to populate the raster plane, and transfer the batch histogram upon completion, and a central processing unit (CPU) to receive the batch histogram from the GPU, and display a map of the batch histogram on a display.