专利检索 ap:("Tektronix, Inc.") AND inv:"Christopher N. White" 第 1 页

1.

发明公开
SYSTEMS AND METHODS FOR TRAINING AND VALIDATION OF MACHINE-LEARNING-BASED RF TRANSMIT/RECEIVE SYSTEMS 审中-公开

公开(公告)号：US20240364432A1

公开(公告)日：2024-10-31

申请号：US18643943

申请日：2024-04-23

申请人： Tektronix, Inc.

发明人： Christopher N. White , Alexander Krauska , Alejandro C. Buritica

IPC分类号： H04B17/00 , H04B17/10 , H04B17/15

CPC分类号： H04B17/0085 , H04B17/101 , H04B17/191

摘要： A test and measurement device includes a signal generator to generate a test signal, a signal analyzer to receive a response signal from an adaptive system under test (SUT), communications ports to allow reception of the response signal, and one or more processors to send a signal to the signal generator to generate a first test signal, receive a response signal from the signal analyzer, measure performance of the response signal, and report the performance to at least one of the SUT and a user workspace on the test and measurement device. A method of testing a system under test (SUT) includes generating and sending a test signal with a signal generator, receiving a response signal from the SUT at a signal analyzer, measuring performance of the response signal with respect to the test signal, and reporting the performance to at least one of the SUT and a user workspace.