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公开(公告)号：US20240310413A1
公开(公告)日：2024-09-19
申请号：US18604102
申请日：2024-03-13
申请人： Tektronix, Inc.
CPC分类号： G01R1/203 , G01R1/06794
摘要： A test and measurement accessory includes a shunt configured to be located in a current path including a device under test, the shunt comprising a wire bundle of individually insulated wires as a resistive portion and a sense lead, the wire bundle and the sense lead electrically connected at a first end, a first electrical contact electrically connected to the sense lead at a second end, and a second electrical contact electrically connected to the wires of the wire bundle at the second end to allow measurement of a voltage drop across the first and second electrical contacts. A test and measurement system includes a test and measurement instrument and the test and measurement accessory. A method includes measuring current using the accessory.
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公开(公告)号：US20240061021A1
公开(公告)日：2024-02-22
申请号：US18499143
申请日：2023-10-31
申请人： Tektronix, Inc.
CPC分类号： G01R15/181 , G01R19/0092 , G01R15/146
摘要： A current measurement device with a shunt resistor of a resistive core with an opening and measurement leads, a Rogowski coil with electrical contacts surrounding the resistive core, conductive layers on first and second sides of the resistive core, one or more insulative layers between the conductive layers and the Rogowski coil, the current measurement device configured to combine signals from the shunt resistor and the Rogowski core. The current measurement device may have a Rogowski coil on a flexible substrate at least partially wrapped around the shunt resistor. A current measurement device has a rigid substrate, vias filled with a conductive material through the rigid substrate, conductive layers on the top surface and the bottom surface connecting to the vias to form a Rogowski coil structure, one or more insulative layers directly on the coil structure, a shunt resistor directly on the one or more insulative layers.
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