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公开(公告)号：USD1038797S1
公开(公告)日：2024-08-13
申请号：US29903039
申请日：2023-09-19
Applicant: Tektronix, Inc.
Designer： Chris A. Valentine , Neil Clayton , David M. Ediger , Marc A. Gessford , Taylor S. K. Heen , Brian A. Hollenberg , Steve U. Reinhold , Prashanth Thota , Satya N. Whitlock
Abstract: FIG. 1 is a top, rear, left, isometric view of a battery accessory for a test and measurement instrument showing the new design in conjunction with a typical operating environment;
FIG. 2 is a top, front, right isometric view thereof;
FIG. 3 is a rear elevational view thereof,
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a top plan view thereof and,
FIG. 7 is a bottom plan view thereof.
The broken lines in the drawings depict environmental structure as well as unclaimed portions of the battery accessory for a test and measurement instrument, neither of which form any part of the claimed design.-
公开(公告)号：USD1003181S1
公开(公告)日：2023-10-31
申请号：US29809745
申请日：2021-09-29
Applicant: Tektronix, Inc.
Designer： Chris A. Valentine , Neil Clayton , David M. Ediger , Marc A. Gessford , Taylor S. K. Heen , Brian A. Hollenberg , Steve U. Reinhold , Prashanth Thota , Satya N. Whitlock
Abstract: FIG. 1 is a top, front, right, isometric view of a test and measurement instrument showing the new design;
FIG. 2 is a top, rear, left isometric view thereof;
FIG. 3 is a front elevational view thereof
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof;
FIG. 8 is a rear elevational view thereof;
FIG. 9 is a top, front, right, isometric view of another embodiment of a test and measurement instrument showing the new design;
FIG. 10 is a top, rear, left isometric view thereof;
FIG. 11 is a front elevational view thereof
FIG. 12 is a left side elevational view thereof;
FIG. 13 is a right side elevational view thereof;
FIG. 14 is a top plan view thereof;
FIG. 15 is a bottom plan view thereof; and,
FIG. 16 is a rear elevational view thereof.
The broken lines in the drawings depict environmental structure as well as unclaimed portions of the test and measurement instrument and accessories, neither of which form any part of the claimed design.-
公开(公告)号：US12055416B2
公开(公告)日：2024-08-06
申请号：US17953234
申请日：2022-09-26
Applicant: Tektronix, Inc.
Inventor： Chris A. Valentine , David M. Ediger , Prashanth Thota
IPC: G01D11/30
CPC classification number: G01D11/30
Abstract: A stand for receiving a portable test and measurement instrument includes a base plate, a first portion extending orthogonally from the generally flat base, the first portion including one or more holes spaced in a pattern through which one or more fasteners may attach the test and measurement instrument to the stand, and a second portion adjacent to and extending at an angle from the first portion, the second portion including one or more holes spaced in a pattern through which one or more fasteners may attach the test and measurement instrument to the stand.
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公开(公告)号：US20240061021A1
公开(公告)日：2024-02-22
申请号：US18499143
申请日：2023-10-31
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Emily L. Becher , David M. Ediger , Matthew J. Hull , Daniel G. Knierim
CPC classification number: G01R15/181 , G01R19/0092 , G01R15/146
Abstract: A current measurement device with a shunt resistor of a resistive core with an opening and measurement leads, a Rogowski coil with electrical contacts surrounding the resistive core, conductive layers on first and second sides of the resistive core, one or more insulative layers between the conductive layers and the Rogowski coil, the current measurement device configured to combine signals from the shunt resistor and the Rogowski core. The current measurement device may have a Rogowski coil on a flexible substrate at least partially wrapped around the shunt resistor. A current measurement device has a rigid substrate, vias filled with a conductive material through the rigid substrate, conductive layers on the top surface and the bottom surface connecting to the vias to form a Rogowski coil structure, one or more insulative layers directly on the coil structure, a shunt resistor directly on the one or more insulative layers.
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Patent Agency Ranking
公开(公告)号：US20240118314A1
公开(公告)日：2024-04-11
申请号：US18480457
申请日：2023-10-03
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , David M. Ediger , Daniel G. Knierim , David Thomas Engquist
CPC classification number: G01R1/06755 , H01B7/04 , H01B9/006 , H01B9/02
Abstract: A cable assembly has a connector to receive a signal, a cable connected to the connector, the cable having a length and one or more conductors along at least part of the length to conduct the signal, a magnetic material external to the one or more conductors, and an elastomer material external to the one or more conductors. A cable assembly has a connector to receive a differential signal, a cable connected to the connector having symmetric pair conductors, one or more discrete magnetic components spaced along the length of the cable, and one or more elastomer components next to at least one of the one or more magnetic components. A cable assembly has a connector to receive a differential signal, a cable connected to the connector having symmetric pair conductors, an elastomer material at least partially enclosing the cable, and a magnetic material at least partially enclosing the cable.
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公开(公告)号：US20230375596A1
公开(公告)日：2023-11-23
申请号：US18198800
申请日：2023-05-17
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Julie A. Campbell , David M. Ediger
CPC classification number: G01R15/146 , G01R19/10
Abstract: A test and measurement accessory has a shunt configured to be located in a current path between a busbar and an electronic module and structured to minimize length added to the current path, the shunt having an opening extending through the shunt, and a resistive portion, the resistive portion configured to form a portion of the current path, and two or more contacts, at least one of the contacts extending through the opening and electrically insulated from the resistive portion of the shunt. A test and measurement accessory has a shunt, two or more contacts, at least one of the contacts extending through the opening, and a resistive portion comprising a plurality of resistors surrounding an insulative portion. A test and measurement accessory has a shunt including a washer having an opening, a resistive portion, and two or more contacts.
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公开(公告)号：USD1038798S1
公开(公告)日：2024-08-13
申请号：US29903042
申请日：2023-09-19
Applicant: Tektronix, Inc.
Designer： Chris A. Valentine , Neil Clayton , David M. Ediger , Marc A. Gessford , Taylor S. K. Heen , Brian A. Hollenberg , Steve U. Reinhold , Prashanth Thota , Satya N. Whitlock
Abstract: FIG. 1 is a top, front, right, isometric view of a test and measurement instrument with stand and battery showing the new design in a first operating position;
FIG. 2 is a top, rear, left isometric view thereof;
FIG. 3 is a front elevational view thereof
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof;
FIG. 8 is a rear elevational view thereof;
FIG. 9 is a top, front, right, isometric view of a test and measurement instrument with stand and battery showing the new design a second operating position;
FIG. 10 is a top, rear, left isometric view thereof;
FIG. 11 is a front elevational view thereof
FIG. 12 is a left side elevational view thereof;
FIG. 13 is a right side elevational view thereof;
FIG. 14 is a top plan view thereof;
FIG. 15 is a bottom plan view thereof; and,
FIG. 16 is a rear elevational view thereof.
The broken lines in the drawings depict environmental structure as well as unclaimed portions of the test and measurement instrument with stand and battery, neither of which form any part of the claimed design.-
公开(公告)号：US20240087776A1
公开(公告)日：2024-03-14
申请号：US18243632
申请日：2023-09-07
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Christopher R. Muggli , Daniel G. Knierim , David M. Ediger , Richard N. Atherton
Abstract: A shunt resistor has a substrate having electrically conductive structures to carry current in a current path, a resistive portion in electrical contact with the electrically conductive structures, and one or more canceling inductance leads electrically connected to the electrically conductive structures and the resistive portion, the one or more canceling inductance configured to cancel inductive effects in a voltage measurement across the resistive portion. A modular tip interconnect has a connector at a first end of the interconnect configured to connect to a probe tip of a test and measurement instrument, and the above shunt resistor located at a second end of the interconnect configured to connect to a device under test (DUT).
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公开(公告)号：US20230016996A1
公开(公告)日：2023-01-19
申请号：US17953234
申请日：2022-09-26
Applicant: Tektronix, Inc.
Inventor： Chris A. Valentine , David M. Ediger , Prashanth Thota
IPC: G01D11/30
Abstract: A stand for receiving a portable test and measurement instrument includes a base plate, a first portion extending orthogonally from the generally flat base, the first portion including one or more holes spaced in a pattern through which one or more fasteners may attach the test and measurement instrument to the stand, and a second portion adjacent to and extending at an angle from the first portion, the second portion including one or more holes spaced in a pattern through which one or more fasteners may attach the test and measurement instrument to the stand.
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