公开(公告)号：US11442105B2

公开(公告)日：2022-09-13

申请号：US16740112

申请日：2020-01-10

Applicant: Tektronix, Inc.

Inventor： Sriram Mandyam Krishnakumar ,  Mahesha Guttahalli Lakshmipathy ,  Satish Kumar Makanahalli Ramaiah ,  Vishnu Vardhan Kandan ,  Rovin Jolly Pulikken

IPC: G01R31/3183 ,  G01R31/28

Abstract: Disaggregated distributed measurement analysis systems provide a test and measurement automation platform that uses solution workflow metadata to create automation test suites as solutions to be deployed in an automation engine of a test and measurement automation platform. The automation platform provides tools and techniques to develop measurements and deploy solutions in an automation engine without requiring the system to restart. The system enables, by the test and measurement automation platform, a user to develop measurements for the solutions and deploy and execute each of the solutions in the automation engine of the test and measurement automation platform without requiring the solution to compile.

公开(公告)号：US20200225287A1

公开(公告)日：2020-07-16

申请号：US16740112

申请日：2020-01-10

Applicant: Tektronix, Inc.

Inventor： Sriram Mandyam Krishnakumar ,  Mahesha Guttahalli Lakshmipathy ,  Satish Kumar Makanahalli Ramaiah ,  Vishnu Vardhan Kandan ,  Rovin Jolly Pulikken

IPC: G01R31/3183 ,  G01R31/28

Abstract: Disaggregated distributed measurement analysis systems provide a test and measurement automation platform that uses solution workflow metadata to create automation test suites as solutions to be deployed in an automation engine of a test and measurement automation platform. The automation platform provides tools and techniques to develop measurements and deploy solutions in an automation engine without requiring the system to restart. The system enables, by the test and measurement automation platform, a user to develop measurements for the solutions and deploy and execute each of the solutions in the automation engine of the test and measurement automation platform without requiring the solution to compile.