公开(公告)号：US20240274222A1

公开(公告)日：2024-08-15

申请号：US18534495

申请日：2023-12-08

Applicant: Tektronix, Inc.

Inventor： Swapnil Jhawar ,  Chandra Sekhar Kappagantu ,  Mahesha Guttahalli Lakshmipathy ,  Sriram Mandyam Krishnakumar

IPC: G11C29/56

CPC classification number: G11C29/56004 ,  G11C29/56008 ,  G11C29/56016

Abstract: A test and measurement system includes a multi-stack test subsystem including a plurality of test and measurement instruments, each instrument coupled to a device under test (DUT) to receive a plurality of test signals from the DUT during a test mode of operation. One test and measurement instrument is designated as a master and the remainder are designated as extension test and measurement instruments. The master communicates control signals to each of the extensions to synchronize the test and measurement instruments to simultaneously acquire the plurality of test signals provided by the DUT. An automation engine is coupled to the multi-stack test subsystem to receive the acquired plurality of test signals from the master, and the automation engine analyzes the acquired test signals to perform validation testing for each of plurality of test signals and simultaneously display results of the validation testing for the plurality of test signals.