公开(公告)号：US20210013818A1

公开(公告)日：2021-01-14

申请号：US16921865

申请日：2020-07-06

Applicant: Tektronix, Inc.

Inventor： U N Vasudev ,  Krishna N H Sri ,  Vempati L. Bharghavi

IPC: H02P21/00 ,  H02P27/06

Abstract: A test and measurement device includes an interface configured to acquire analog three-phase signals from a device under test, and a processor programmed to execute instructions that cause the processor to perform a direct-quadrature-zero, DQ0, transformation and produce DQ0 signals based on the analog three-phase signals, and measure performance of the device under test based on the DQ0 signals. A method includes acquiring three-phase signals from a device under test, performing a direct-quadrature-zero, DQ0, transformation on the three-phase signals to produce DQ0 signals, and using the DQ0 signals to measure performance of the device under test.

公开(公告)号：US12088223B2

公开(公告)日：2024-09-10

申请号：US16921865

申请日：2020-07-06

Applicant: Tektronix, Inc.

Inventor： U N Vasudev ,  Krishna N H Sri ,  Vempati L. Bharghavi ,  Omer Sheikh

IPC: H02P21/00 ,  H02P27/06

CPC classification number: H02P21/0003 ,  H02P27/06

Abstract: A test and measurement device includes an interface configured to acquire analog three-phase signals from a device under test, and a processor programmed to execute instructions that cause the processor to perform a direct-quadrature-zero, DQ0, transformation and produce DQ0 signals based on the analog three-phase signals, and measure performance of the device under test based on the DQ0 signals. A method includes acquiring three-phase signals from a device under test, performing a direct-quadrature-zero, DQ0, transformation on the three-phase signals to produce DQ0 signals, and using the DQ0 signals to measure performance of the device under test.