公开(公告)号：US11275131B1

公开(公告)日：2022-03-15

申请号：US16599067

申请日：2019-10-10

Applicant: Tektronix, Inc.

Inventor： U N Vasudev ,  Suman Babu Alaparthi ,  Niranjan R Hegde ,  Krishna N H Sri

IPC: G01R33/14 ,  G01R33/02 ,  H01F27/24

Abstract: A test and measurement instrument, including at least one port configured to receive a signal from a device under test (DUT), the signal including a current signal acquired across a magnetic core of the DUT and a voltage signal acquired across the magnetic core of the DUT, and one or more processors. The one or more processors are configured to determine a hysteresis loop based on the current signal and the voltage signal, determine a magnetic flux of the magnetic core based on the voltage signal and the current signal for a number of sample points for each cycle, and determine a maximum magnetic flux for all cycles and a hysteresis loop cycle that corresponds to the maximum magnetic flux. A display configured to display at least one of the hysteresis loop, the signal received from the DUT, and the hysteresis loop cycle that corresponds to the maximum magnetic flux.

公开(公告)号：US20210013818A1

公开(公告)日：2021-01-14

申请号：US16921865

申请日：2020-07-06

Applicant: Tektronix, Inc.

Inventor： U N Vasudev ,  Krishna N H Sri ,  Vempati L. Bharghavi

IPC: H02P21/00 ,  H02P27/06

Abstract: A test and measurement device includes an interface configured to acquire analog three-phase signals from a device under test, and a processor programmed to execute instructions that cause the processor to perform a direct-quadrature-zero, DQ0, transformation and produce DQ0 signals based on the analog three-phase signals, and measure performance of the device under test based on the DQ0 signals. A method includes acquiring three-phase signals from a device under test, performing a direct-quadrature-zero, DQ0, transformation on the three-phase signals to produce DQ0 signals, and using the DQ0 signals to measure performance of the device under test.

公开(公告)号：US12088223B2

公开(公告)日：2024-09-10

申请号：US16921865

申请日：2020-07-06

Applicant: Tektronix, Inc.

Inventor： U N Vasudev ,  Krishna N H Sri ,  Vempati L. Bharghavi ,  Omer Sheikh

IPC: H02P21/00 ,  H02P27/06

CPC classification number: H02P21/0003 ,  H02P27/06

Abstract: A test and measurement device includes an interface configured to acquire analog three-phase signals from a device under test, and a processor programmed to execute instructions that cause the processor to perform a direct-quadrature-zero, DQ0, transformation and produce DQ0 signals based on the analog three-phase signals, and measure performance of the device under test based on the DQ0 signals. A method includes acquiring three-phase signals from a device under test, performing a direct-quadrature-zero, DQ0, transformation on the three-phase signals to produce DQ0 signals, and using the DQ0 signals to measure performance of the device under test.

公开(公告)号：US10895612B2

公开(公告)日：2021-01-19

申请号：US16160879

申请日：2018-10-15

Applicant: Tektronix, Inc.

Inventor： U N Vasudev ,  Gajendra Kumar Patro ,  Krishna N H Sri

IPC: G01R33/14

Abstract: A test and measurement instrument, comprising at least one port configured to receive a signal from a device under test; a user interface configured to receive a user input, the user input indicating magnetic properties of a magnetic material of the device under test, and one or more processors. The one or more processors are configured to generate a hysteresis loop mask based on the magnetic properties of the magnetic material, determine whether the signal received from the device under test violates the hysteresis loop mask, and generate an alert when the signal received from the device under test violates the hysteresis loop mask. The test and measurement instrument may also include a display configured to display the hysteresis loop mask, the signal received from the device under test, and/or the alert.