公开(公告)号：US20200182925A1

公开(公告)日：2020-06-11

申请号：US16792671

申请日：2020-02-17

Applicant: Texas Instruments Incorporated

Inventor： Sigfredo E. Gonzalez Diaz ,  Benjamin Lee Amey ,  Patrick Michael Teterud ,  Hung Nguyen

IPC: G01R31/26

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

公开(公告)号：US20220260627A1

公开(公告)日：2022-08-18

申请号：US17739911

申请日：2022-05-09

Applicant: Texas Instruments Incorporated

Inventor： Sigfredo E. Gonzalez Diaz ,  Benjamin Lee Amey ,  Patrick Michael Teterud ,  Hung Nguyen

IPC: G01R31/26

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

公开(公告)号：US11353494B2

公开(公告)日：2022-06-07

申请号：US16792671

申请日：2020-02-17

Applicant: Texas Instruments Incorporated

Inventor： Sigfredo E. Gonzalez Diaz ,  Benjamin Lee Amey ,  Patrick Michael Teterud ,  Hung Nguyen

IPC: G01R31/26

Abstract: A testing system includes: a substrate having a probe pad and having a supply input; driver circuitry having a driver output; a transistor having a gate, a source, and a drain; and a field effect transistor (FET) engager. The gate of the transistor is coupled to the driver output, and the drain of the transistor is coupled to the supply input. The FET engager is configured to couple the probe pad to the gate of the transistor and provide test instrument measurement of gate current of the transistor without test instrument probe capacitance impacting operation of the transistor.

公开(公告)号：US11624769B2

公开(公告)日：2023-04-11

申请号：US17739911

申请日：2022-05-09

Applicant: Texas Instruments Incorporated

Inventor： Sigfredo E. Gonzalez Diaz ,  Benjamin Lee Amey ,  Patrick Michael Teterud ,  Hung Nguyen

IPC: G01R31/26

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

公开(公告)号：US20180180661A1

公开(公告)日：2018-06-28

申请号：US15389443

申请日：2016-12-22

Applicant: Texas Instruments Incorporated

Inventor： Sigfredo E. Gonzalez Diaz ,  Benjamin Lee Amey ,  Patrick Michael Teterud ,  Hung Nguyen

IPC: G01R31/26

CPC classification number: G01R31/2623

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.