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公开(公告)号：US20140025610A1
公开(公告)日：2014-01-23
申请号：US14033690
申请日：2013-09-23
Applicant: The Boeing Company
Inventor： Barry R. Fox , Steven Jowers
IPC: G06N99/00
CPC classification number: G06Q10/06313 , G06F7/60 , G06F17/11 , G06N99/005 , G06Q10/04
Abstract: A system is provided for benchmarking a progressive combinatorial solver. The system may initialize a parametric model collector, and perform a plurality of parametric trials associated with respective numbers of sub-part iterations of the progressive combinatorial solver. For each of the plurality of parametric trials, the system may initialize a statistical data collector. The system may perform a plurality of randomized executions of the progressive combinatorial solver, and add data including metric values for respective solutions of the executions to the statistical data collector. The system may then determine statistical parameter(s) of data in the statistical data collector, and add data including an indication of the respective number of sub-part iterations, a cost of finding the metric values for the respective solutions, and the statistical parameters of the trial to the parametric data collector. And the system may determine a best-fit model from data in the parametric data collector.
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Patent Agency Ranking
公开(公告)号：US20190304735A1
公开(公告)日：2019-10-03
申请号：US15940796
申请日：2018-03-29
Applicant: The Boeing Company
Inventor： Morteza Safai , Gary Georgeson , Barry R. Fox
Abstract: Systems, methods, and apparatus for a multi-spectral X-ray target and source are disclosed. In one or more embodiments, a disclosed method comprises emitting, by a source of the X-ray generator, electrons towards a section of a multi-spectral X-ray target of the X-ray generator. In one or more embodiments, the multi-spectral X-ray target is rotatable and comprises a plurality of sections, which each comprise an X-ray generating material and at least two of the sections comprise a different X-ray generating material. The method further comprises generating a set of X-rays, when the electrons impinge on the section of the multi-spectral X-ray target. The method further comprises rotating the multi-spectral X-ray target such that the source is in position to project the electrons towards another section of the multi-spectral X-ray target. Further, the method comprises repeating the above method steps for all of the remaining sections of the multi-spectral X-ray target.
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公开(公告)号：US08983881B2
公开(公告)日：2015-03-17
申请号：US14480858
申请日：2014-09-09
Applicant: The Boeing Company
Inventor： Barry R. Fox , Steven Jowers
CPC classification number: G06Q10/06313 , G06F7/60 , G06F17/11 , G06N99/005 , G06Q10/04
Abstract: A system is provided for benchmarking a progressive combinatorial solver. The system may initialize a parametric model collector, and perform a plurality of parametric trials associated with respective numbers of sub-part iterations of the progressive combinatorial solver. For each of the plurality of parametric trials, the system may initialize a statistical data collector. The system may perform a plurality of randomized executions of the progressive combinatorial solver, and add data including metric values for respective solutions of the executions to the statistical data collector. The system may then determine statistical parameter(s) of data in the statistical data collector, and add data including an indication of the respective number of sub-part iterations, a cost of finding the metric values for the respective solutions, and the statistical parameters of the trial to the parametric data collector. And the system may determine a best-fit model from data in the parametric data collector.
Abstract translation: 提供了一种用于对逐行组合求解器进行基准测试的系统。 该系统可以初始化参数模型收集器，并且执行与逐行组合求解器的相应数量的子部分迭代相关联的多个参数化试验。 对于多个参数试验中的每一个，系统可以初始化统计数据收集器。 系统可执行逐行组合求解器的多个随机化执行，并将包括执行的各个解的度量值的数据添加到统计数据收集器。 然后，系统可以确定统计数据收集器中的数据的统计参数，并且添加数据，包括相应数量的子部分迭代的指示，找到各个解的度量值的成本以及统计参数 的试验到参数数据采集器。 并且系统可以根据参数数据收集器中的数据确定最佳拟合模型。
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公开(公告)号：US20140379401A1
公开(公告)日：2014-12-25
申请号：US14480858
申请日：2014-09-09
Applicant: The Boeing Company
Inventor： Barry R. Fox , Steven Jowers
IPC: G06Q10/06
CPC classification number: G06Q10/06313 , G06F7/60 , G06F17/11 , G06N99/005 , G06Q10/04
Abstract: A system is provided for benchmarking a progressive combinatorial solver. The system may initialize a parametric model collector, and perform a plurality of parametric trials associated with respective numbers of sub-part iterations of the progressive combinatorial solver. For each of the plurality of parametric trials, the system may initialize a statistical data collector. The system may perform a plurality of randomized executions of the progressive combinatorial solver, and add data including metric values for respective solutions of the executions to the statistical data collector. The system may then determine statistical parameter(s) of data in the statistical data collector, and add data including an indication of the respective number of sub-part iterations, a cost of finding the metric values for the respective solutions, and the statistical parameters of the trial to the parametric data collector. And the system may determine a best-fit model from data in the parametric data collector.
Abstract translation: 提供了一种用于对逐行组合求解器进行基准测试的系统。 该系统可以初始化参数模型收集器，并且执行与逐行组合求解器的相应数量的子部分迭代相关联的多个参数化试验。 对于多个参数试验中的每一个，系统可以初始化统计数据收集器。 系统可执行逐行组合求解器的多个随机化执行，并将包括执行的各个解的度量值的数据添加到统计数据收集器。 然后，系统可以确定统计数据收集器中的数据的统计参数，并且添加数据，包括相应数量的子部分迭代的指示，找到各个解的度量值的成本以及统计参数 的试验到参数数据采集器。 并且系统可以根据参数数据收集器中的数据确定最佳拟合模型。
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公开(公告)号：US10748735B2
公开(公告)日：2020-08-18
申请号：US15940796
申请日：2018-03-29
Applicant: The Boeing Company
Inventor： Morteza Safai , Gary Georgeson , Barry R. Fox
Abstract: Systems, methods, and apparatus for a multi-spectral X-ray target and source are disclosed. In one or more embodiments, a disclosed method comprises emitting, by a source of the X-ray generator, electrons towards a section of a multi-spectral X-ray target of the X-ray generator. In one or more embodiments, the multi-spectral X-ray target is rotatable and comprises a plurality of sections, which each comprise an X-ray generating material and at least two of the sections comprise a different X-ray generating material. The method further comprises generating a set of X-rays, when the electrons impinge on the section of the multi-spectral X-ray target. The method further comprises rotating the multi-spectral X-ray target such that the source is in position to project the electrons towards another section of the multi-spectral X-ray target. Further, the method comprises repeating the above method steps for all of the remaining sections of the multi-spectral X-ray target.
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公开(公告)号：US08849733B2
公开(公告)日：2014-09-30
申请号：US14033690
申请日：2013-09-23
Applicant: The Boeing Company
Inventor： Barry R. Fox , Steven Jowers
CPC classification number: G06Q10/06313 , G06F7/60 , G06F17/11 , G06N99/005 , G06Q10/04
Abstract: A system is provided for benchmarking a progressive combinatorial solver. The system may initialize a parametric model collector, and perform a plurality of parametric trials associated with respective numbers of sub-part iterations of the progressive combinatorial solver. For each of the plurality of parametric trials, the system may initialize a statistical data collector. The system may perform a plurality of randomized executions of the progressive combinatorial solver, and add data including metric values for respective solutions of the executions to the statistical data collector. The system may then determine statistical parameter(s) of data in the statistical data collector, and add data including an indication of the respective number of sub-part iterations, a cost of finding the metric values for the respective solutions, and the statistical parameters of the trial to the parametric data collector. And the system may determine a best-fit model from data in the parametric data collector.
Abstract translation: 提供了一种用于对逐行组合求解器进行基准测试的系统。 该系统可以初始化参数模型收集器，并且执行与逐行组合求解器的相应数量的子部分迭代相关联的多个参数化试验。 对于多个参数试验中的每一个，系统可以初始化统计数据收集器。 系统可执行逐行组合求解器的多个随机化执行，并将包括执行的各个解的度量值的数据添加到统计数据收集器。 然后，系统可以确定统计数据收集器中的数据的统计参数，并且添加数据，包括相应数量的子部分迭代的指示，找到各个解的度量值的成本以及统计参数 的试验到参数数据采集器。 并且系统可以根据参数数据收集器中的数据确定最佳拟合模型。
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