公开(公告)号：US20160054221A1

公开(公告)日：2016-02-25

申请号：US14463004

申请日：2014-08-19

Applicant: The Boeing Company

Inventor： Stephen Kerry Wilcken

IPC: G01N21/47

CPC classification number: G01N21/4738 ,  G01N21/55 ,  G01N2201/02 ,  G01N2201/061 ,  G01N2201/06113 ,  G01N2201/0636 ,  G01N2201/0637

Abstract: A system for characterizing a bi-directional reflectance distribution function scattered light pattern of a portion of a sample is disclosed. The system can comprise a hemispherical member comprising an reflective inner surface; an entrance port operable to receive electromagnetic radiation from an electromagnetic radiation source; a first reflective optical element operable to receive at least a portion of the electromagnetic radiation and to direct the at least the portion of the electromagnetic radiation onto the portion of the sample to be characterized; a wide-angle lens operable receive the electromagnetic radiation that was specularly reflected and diffusely scattered from the portion of the sample onto the inner surface of the hemispherical member; and an imaging device operable to record intensity information imaged by the wide-angle lens to characterize the bi-directional reflectance distribution function scattered light pattern of the portion of the sample.

Abstract translation: 公开了一种用于表征样品的一部分的双向反射分布函数散射光图案的系统。 该系统可以包括半球形构件，其包括反射内表面; 入口端口，其可操作以从电磁辐射源接收电磁辐射; 第一反射光学元件，其可操作以接收所述电磁辐射的至少一部分并且将所述电磁辐射的至少一部分引导到要表征的所述样品的所述部分上; 广角镜可操作地接收从样品部分镜面反射和漫射散射到半球形构件的内表面上的电磁辐射; 以及成像装置，其可操作以记录由广角镜头成像的强度信息，以表征样品部分的双向反射分布函数散射光图案。

公开(公告)号：US09322776B2

公开(公告)日：2016-04-26

申请号：US14463004

申请日：2014-08-19

Applicant: The Boeing Company

Inventor： Stephen Kerry Wilcken

IPC: G01N21/47

CPC classification number: G01N21/4738 ,  G01N21/55 ,  G01N2201/02 ,  G01N2201/061 ,  G01N2201/06113 ,  G01N2201/0636 ,  G01N2201/0637

Abstract: A system for characterizing a bi-directional reflectance distribution function scattered light pattern of a portion of a sample is disclosed. The system can comprise a hemispherical member comprising an reflective inner surface; an entrance port operable to receive electromagnetic radiation from an electromagnetic radiation source; a first reflective optical element operable to receive at least a portion of the electromagnetic radiation and to direct the at least the portion of the electromagnetic radiation onto the portion of the sample to be characterized; a wide-angle lens operable receive the electromagnetic radiation that was specularly reflected and diffusely scattered from the portion of the sample onto the inner surface of the hemispherical member; and an imaging device operable to record intensity information imaged by the wide-angle lens to characterize the bi-directional reflectance distribution function scattered light pattern of the portion of the sample.

Abstract translation: 公开了一种用于表征样品的一部分的双向反射分布函数散射光图案的系统。 该系统可以包括半球形构件，其包括反射内表面; 入口端口，其可操作以从电磁辐射源接收电磁辐射; 第一反射光学元件，其可操作以接收所述电磁辐射的至少一部分并且将所述电磁辐射的至少一部分引导到要表征的所述样品的所述部分上; 广角镜可操作地接收从样品部分镜面反射和漫射散射到半球形构件的内表面上的电磁辐射; 以及成像装置，其可操作以记录由广角镜头成像的强度信息，以表征样品部分的双向反射分布函数散射光图案。