Automatic electron beam alignment and astigmatism correction in scanning
electron microscope
    3.
    发明授权
    Automatic electron beam alignment and astigmatism correction in scanning electron microscope 失效
    扫描电子显微镜中自动电子束对准和散光校正

    公开(公告)号:US5627373A

    公开(公告)日:1997-05-06

    申请号:US664578

    申请日:1996-06-17

    申请人: William A. Keese

    发明人: William A. Keese

    IPC分类号: H01J37/26 H01J37/252

    摘要: A border of a circular specimen defining a high contrast feature is imaged. Multiple border portions are sampled at a magnification showing each portion as a straight edge. For alignment a location indicator signal is generated at each of minimum and maximum focal range. Image translation is detected from the two signals, and alignment automatically adjusted. The process repeats for subsequent border portions at a 90.degree. interval until image translation falls for a sample is less than a threshold. For astigmatism correction border portions are sampled about the entire specimen circumference at a 30.degree. interval. An axis of beam distortion is identified based upon a maximum image translation axis among the samples. Distortion is adjusted along such axis. Then, astigmatism connection signal strength is indexed and astigmatism correction is repeated iteratively until correction for a current iteration is less than a given threshold.

    摘要翻译: 成像定义高对比度特征的圆形样本的边界。 以显示每个部分为直边的放大倍率对多个边界部分进行采样。 为了对准,在最小和最大焦距范围的每一个处产生位置指示器信号。 从两个信号中检测出图像转换,并对齐自动调整。 该过程对于随后的边界部分以90度间隔重复,直到样品的图像平移下降小于阈值。 对于散光校正边界部分以30度间隔围绕整个样本周长取样。 基于样本中的最大图像平移轴来识别光束失真的轴。 扭曲沿着此轴调整。 然后,对像散连接信号强度进行索引,并且迭代地重复像散校正,直到当前迭代的校正小于给定阈值。