-
1.
公开(公告)号:US20230290659A1
公开(公告)日:2023-09-14
申请号:US18180995
申请日:2023-03-09
Applicant: Tokyo Electron Limited
Inventor: Keiichi Saiki
IPC: H01L21/67
CPC classification number: H01L21/67288 , H01L21/67092 , H01L21/67259 , H01L21/6838
Abstract: A computer-readable recording medium having stored thereon computer-executable instructions that, in response to execution on a computer, cause a processing to be performed is provided. The processing includes acquiring displacement data of multiple points on a surface of a substrate held by a chuck; specifying a distribution of displacements of the surface based on the acquired displacement data; and determining a type of a foreign matter based on the specified distribution.
-
公开(公告)号:US20240006207A1
公开(公告)日:2024-01-04
申请号:US18341903
申请日:2023-06-27
Applicant: Tokyo Electron Limited
Inventor: Takashi Nakamitsu , Tetsuya Maki , Yosuke Omori , Keiichi Saiki
IPC: H01L21/67 , H01L21/18 , H01L21/68 , H01L21/683
CPC classification number: H01L21/67259 , H01L21/67017 , H01L21/187 , H01L21/681 , H01L21/6838
Abstract: A bonding apparatus includes a first holder; a second holder; a horizontally moving unit; an elevating unit; an inclination measuring unit; and a controller. The first holder is configured to attract and hold a first substrate on a bottom surface thereof. The second holder is disposed under the first holder and configured to attract and hold a second substrate on a top surface thereof. The horizontally moving unit is configured to move the first substrate and the second substrate relative to each other in a horizontal direction. The elevating unit is configured to move the second substrate up and down between a proximate position and a spaced position. The inclination measuring unit is configured to measure an inclination of the second holder. The controller calculates a position of the second substrate in the horizontal direction based on a measurement result of the inclination measuring unit.
-