-
公开(公告)号:US10151031B2
公开(公告)日:2018-12-11
申请号:US15617102
申请日:2017-06-08
发明人: Hitoshi Kato , Jun Sato , Masahiro Murata , Kentaro Oshimo , Tomoko Sugano , Shigehiro Miura
IPC分类号: H01L21/02 , C23C16/458 , C23C16/455 , C23C16/34 , C23C16/507 , C23C16/52
摘要: A method for processing a substrate is provided. According to the method, a process gas is supplied to a surface of a substrate, and then a separation gas is supplied to the surface of the substrate. Moreover, a first plasma processing gas is supplied to the surface of the substrate in a first state in which a distance between the first plasma generation unit and the turntable is set at a first distance, and a second plasma processing gas is supplied to the surface of the substrate in a second state in which a distance between the second plasma generation unit and the turntable is set at a second distance shorter than the first distance. Furthermore, the separation gas is supplied to the surface of the substrate.
-
公开(公告)号:US09714467B2
公开(公告)日:2017-07-25
申请号:US14613656
申请日:2015-02-04
发明人: Hitoshi Kato , Jun Sato , Masahiro Murata , Kentaro Oshimo , Tomoko Sugano , Shigehiro Miura
IPC分类号: C23C16/458 , C23C16/44 , C23C16/52 , H01L21/02 , C23C16/34 , C23C16/455 , C23C16/507
CPC分类号: C23C16/4584 , C23C16/345 , C23C16/45519 , C23C16/45538 , C23C16/45551 , C23C16/507 , C23C16/52 , H01L21/0217 , H01L21/02274 , H01L21/0228
摘要: A method for processing a substrate is provided. According to the method, a process gas is supplied to a surface of a substrate, and then a separation gas is supplied to the surface of the substrate. Moreover, a first plasma processing gas is supplied to the surface of the substrate in a first state in which a distance between the first plasma generation unit and the turntable is set at a first distance, and a second plasma processing gas is supplied to the surface of the substrate in a second state in which a distance between the second plasma generation unit and the turntable is set at a second distance shorter than the first distance. Furthermore, the separation gas is supplied to the surface of the substrate.
-