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公开(公告)号：US06706427B2
公开(公告)日：2004-03-16
申请号：US09741978
申请日：2000-12-20
IPC分类号： G11B566
CPC分类号： B82Y15/00 , B32B17/10981 , C03C15/00 , C03C17/25 , C03C19/00 , C03C21/002 , C03C23/008 , C03C2204/08 , C03C2217/213 , C03C2218/111 , G11B5/7315 , G11B5/8404 , Y10S428/90 , Y10T428/315 , Y10T428/3154
摘要： There are disclosed an information recording medium substrate having a surface roughness of Rmax 15 nm or less, and an information recording medium, particularly an information recording medium substrate and information recording medium in which for surfaces of the substrate and medium, a bearing area value (offset bearing area value) in a depth of 0.5 to 5 nm (predetermined slice level) from a bearing height (real peak height) corresponding to the bearing area value of 0.2% to 1.0% is 90% or less, and a manufacture method of the substrate and medium.
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2.发明授权公开(公告)号：US07220446B2
公开(公告)日：2007-05-22
申请号：US10761771
申请日：2004-01-20
IPC分类号： B32B5/66
CPC分类号： B82Y15/00 , B32B17/10981 , C03C15/00 , C03C17/25 , C03C19/00 , C03C21/002 , C03C23/008 , C03C2204/08 , C03C2217/213 , C03C2218/111 , G11B5/7315 , G11B5/8404 , Y10S428/90 , Y10T428/315 , Y10T428/3154
摘要： There are disclosed an information recording medium substrate having a surface roughness of Rmax 15 nm or less, and an information recording medium, particularly an information recording medium substrate and information recording medium in which for surfaces of the substrate and medium, a bearing area value (offset bearing area value) in a depth of 0.5 to 5 nm (predetermined slice level) from a bearing height (real peak height) corresponding to the bearing area value of 0.2% to 1.0% is 90% or less, and a manufacture method of the substrate and medium.
摘要翻译： 公开了具有Rmax为15nm以下的表面粗糙度的信息记录介质基板，以及信息记录介质，特别是信息记录介质基板和信息记录介质，其中，对于基板和介质的表面，承载面积值（ 偏移轴承面积值）从对应于0.2％〜1.0％的承载面积值的轴承高度（实际峰值高度）为0.5〜5nm（规定切片水平）的90％以下的制造方法 底物和介质。
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3.发明授权Substrate for information recording medium, information recording medium, and method for controlling surface of substrate for information recording medium 有权用于信息记录介质的基板，信息记录介质和用于控制信息记录介质的基板表面的方法公开(公告)号：US06790509B2
公开(公告)日：2004-09-14
申请号：US09969625
申请日：2001-10-04
IPC分类号： G11B566
CPC分类号： G11B5/7315 , G11B5/74 , G11B5/82 , Y10S428/90
摘要： A substrate for an information recording medium, wherein the period of microwaviness is 2 &mgr;m to 4 mm, and if we let wa be the maximum height of this microwaviness and Rmax be the maximum height measured by atomic force microscope, the main surface of the substrate has a wa of no more than 5 nm and an Rmax of no more than 12 nm, provided that wa is the difference between the highest and lowest points on a measurement curve of all measured points in a measurement area.
摘要翻译： 一种用于信息记录介质的基板，其中微波的周期为2μm至4mm，并且如果将该微波的最大高度设为wa，并且Rmax为通过原子力显微镜测量的最大高度，则基板的主表面 具有不大于5nm的wa和不大于12nm的Rmax，条件是wa是测量区域中所有测量点的测量曲线上的最高点和最低点之间的差。
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4.发明授权Substrate for an information recording medium, information recording medium using the substrate, and method of producing the substrate 有权用于信息记录介质的基板，使用该基板的信息记录介质以及该基板的制造方法公开(公告)号：US06852010B2
公开(公告)日：2005-02-08
申请号：US10345228
申请日：2003-01-16
CPC分类号： G11B5/7315 , G11B23/0021 , Y10S428/90 , Y10T428/21 , Y10T428/24355
摘要： A substrate for an information recording medium has a microwaviness average height Ra′ not greater than 0.05 microinch as measured by a contactless laser interference technique for measurement points within a measurement region of 50 μm□-4 mm□ on a surface of the substrate. The microwaviness average height Ra′ is given by: Ra ′ = 1 n ∑ i = 1 n | xi - x _ | , where xi represents a measurement point value of each measurement point, {overscore (x)} representing an average value of the measurement point values, n representing the number of said measurement points. Alternatively, the substrate has a waviness period between 300 μm and 5 mm and a waviness average height Wa of 1.0 nm or less as measured by the contactless laser interference technique for measurement points in a measurement region surrounded by two concentric circles which is spaced from a center of a surface of the substrate by a predetermined distance. The waviness average height Wa is given by: Wa = 1 N ∑ i = 1 N | Xi - X _ | where Xi represents a measurement point value of each measurement point, {overscore (X)} representing an average value of the measurement point values, n representing the number of said measurement points.
摘要翻译： 用于信息记录介质的基板具有通过非接触式激光干涉技术测量的微波平均高度Ra'不大于0.05微英寸，用于在基板表面上的测量区域内的测量点为50um□-4mm□。 微波平均高度Ra'由下式给出：其中xi表示每个测量点的测量点值，{overscore（x表示测量点值的平均值，n表示所述测量点的数量，或者，衬底具有 通过非接触式激光干涉技术测量的测量点在300mum至5mm之间的波纹度以及1.0nm或更小的波纹度平均高度Wa，测量点由与两个表面的中心间隔开的两个同心圆包围的测量区域 波纹平均高度Wa由下式给出：其中Xi表示每个测量点的测量点值，（超标（X表示测量点值的平均值，n表示所述测量点的数量） 。
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公开(公告)号：US06670055B2
公开(公告)日：2003-12-30
申请号：US09925573
申请日：2001-08-09
IPC分类号： G11B566
CPC分类号： G11B5/851 , G11B5/66 , Y10S428/90 , Y10T428/12465 , Y10T428/12847
摘要： A magnetic recording medium that is high coersive force, hard to receive influence of thermal fluctuation, and brings about a considerable improvement of S/N ratio, and in which at least an underlayer and a magnetic layer are sequentially laminated on a substrate, wherein a pre-coat layer is interposed between said underlayer and said substrate and said pre-coat layer is constructed by sequentially laminating a lower layer containing Ni and P and an upper layer made of a Cr alloy.
摘要翻译： 一种磁性记录介质，其具有高的强力，难以接受热波动的影响，并且导致S / N比的显着提高，并且其中至少底层和磁性层依次层压在基板上，其中 预涂层介于所述底层和所述基材之间，并且所述预涂层通过依次层压含有Ni和P的下层和由Cr合金制成的上层来构造。
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6.发明授权Substrate for an information recording medium, information recording medium using the substrate and method of producing the substrate 有权用于信息记录介质的基板，使用该基板的信息记录介质及其制造方法公开(公告)号：US06537648B1
公开(公告)日：2003-03-25
申请号：US09540887
申请日：2000-03-31
IPC分类号： G11B582
CPC分类号： G11B5/7315 , G11B23/0021 , Y10S428/90 , Y10T428/21 , Y10T428/24355
摘要： A substrate for an information recording medium has a microwaviness average height Ra′ not greater than 0.05 microinch as measured by a contactless laser interference technique for measurement points within a measurement region of 50 &mgr;m□-4 mm□ on a surface of the substrate. The microwaviness average height Ra′ is given by: Ra ′ = 1 n ∑ i = 1 n &LeftBracketingBar; x i - x _ &RightBracketingBar; , where xi represents a measurement point value of each measurement point, {overscore (x)} representing an average value of the measurement point values, n representing the number of said measurement points. Alternatively, the substrate has a waviness period between 300 &mgr;m and 5 mm and a waviness average height Wa of 1.0 nm or less as measured by the contactless laser interference technique for measurement points in a measurement region surrounded by two concentric circles which is spaced from a center of a surface of the substrate by a predetermined distance. The waviness average height Wa is given by: Wa = 1 N ∑ i = 1 N &LeftBracketingBar; X I - X _ &RightBracketingBar; where Xi represents a measurement point value of each measurement point, {overscore (X)} representing an average value of the measurement point values, n representing the number of said measurement points.
摘要翻译： 用于信息记录介质的基板具有通过非接触式激光干涉技术测量的微波平均高度Ra'不大于0.05微英寸，用于在基板的表面上的测量区域内的50mum-square-4mms的测量点。 微波平均高度Ra'由下式给出：其中xi表示每个测量点的测量点值，{overscore（x表示测量点值的平均值，n表示所述测量点的数量，或者，衬底具有 通过非接触式激光干涉技术测量的测量点在300mum至5mm之间的波纹度以及1.0nm或更小的波纹平均高度Wa，测量点由两个同心圆包围的测量点测量，该两个同心圆与表面的中心间隔开 波纹平均高度Wa由下式给出：其中Xi表示每个测量点的测量点值，（超标（X表示测量点值的平均值，n表示所述测量点的数量） 。
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公开(公告)号：US08567044B2
公开(公告)日：2013-10-29
申请号：US13223060
申请日：2011-08-31
CPC分类号： G11B5/82 , B82Y10/00 , G11B5/743 , G11B5/8404 , G11B5/855
摘要： A defect inspection is performed for each of glass substrates by a surface defect detector. The distance from the center of the glass substrate to a detected defect, as a radius of a nonmagnetic region to be formed circular, is recorded along with an ID assigned to the glass substrate. Such defect information is recorded in a defect list using a printer or recorded in an RFID tag using an RFID writer. The defect list or the RFID tag is attached to a glass-substrate case. Each glass substrate and its defect information are in one-to-one correspondence and are provided to a customer as a magnetic disk manufacturer. Based on the obtained defect information, the customer manufactures magnetic disks each being a discrete track recording medium having the nonmagnetic region formed at the position where the defect is present.
摘要翻译： 通过表面缺陷检测器对玻璃基板进行缺陷检查。 将从玻璃基板的中心到检测到的缺陷的距离作为形成圆形的非磁性区域的半径与分配给玻璃基板的ID一起被记录。 使用打印机将这样的缺陷信息记录在缺陷列表中，或者使用RFID写入器记录在RFID标签中。 缺陷列表或RFID标签附着在玻璃基板外壳上。 每个玻璃基板及其缺陷信息是一一对应的，并作为磁盘制造商提供给客户。 基于获得的缺陷信息，客户制造磁盘，每个磁盘都是具有在存在缺陷的位置处形成的非磁性区域的离散轨道记录介质。
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8.发明申请METHOD OF MANUFACTURING GLASS SUBSTRATE FOR MAGNETIC DISK AND SYSTEM FOR MANUFACTURING GLASS SUBSTRATE FOR MAGNETIC DISK 有权制造用于磁盘的玻璃基板的制造方法和用于制造用于磁盘的玻璃基板的系统公开(公告)号：US20100024484A1
公开(公告)日：2010-02-04
申请号：US12525251
申请日：2008-01-24
申请人： Ryuuichi Kashima , Hideki Isono , Shinji Eda , Tomotaka Yokoyama , Tadashi Tomonaga , Kraisorn Phandon , Weeraphan Yayod
发明人： Ryuuichi Kashima , Hideki Isono , Shinji Eda , Tomotaka Yokoyama , Tadashi Tomonaga , Kraisorn Phandon , Weeraphan Yayod
IPC分类号： C03C21/00
CPC分类号： B24B9/08 , C03C21/002 , G11B5/8404
摘要： To provide a magnetic-disk glass substrate manufacturing method that can reduce the inner diameter dimensional error.A magnetic-disk glass substrate manufacturing method of this invention including a chemical strengthening step of bringing a plurality of glass substrates 102 into contact with chemical strengthening treatment solutions of a plurality of chemical strengthening treatment baths 130, respectively, to chemically strengthen the glass substrates further includes an inner diameter measuring step of measuring the inner diameter of each of the glass substrates 102 before the chemical strengthening step, a grasping step of grasping a variation of the inner diameter of the glass substrate 102 to be generated by the chemical strengthening step for each of the chemical strengthening treatment baths 130, and a combination determining step of determining the chemical strengthening treatment baths 130, that perform chemical strengthening, based on the variations so that the inner diameters of the glass substrates, whose inner diameters are measured, after the chemical strengthening step become a desired value. In the chemical strengthening step, the glass substrates 102 are chemically strengthened in the determined chemical strengthening treatment baths 130, respectively.
摘要翻译： 提供可以减小内径尺寸误差的磁盘玻璃基板的制造方法。 本发明的磁盘玻璃基板的制造方法包括使多个玻璃基板102分别与多个化学强化处理槽130的化学强化处理液接触的化学强化工序，以进一步化学强化玻璃基板 包括在化学强化步骤之前测量每个玻璃基板102的内径的内径测量步骤，抓取步骤，通过每个步骤获取通过化学强化步骤产生的玻璃基板102的内径的变化 化学强化处理槽130的化学强化处理槽130的化学强化处理槽130的化学强化处理槽130的组合判定步骤，基于这些变化，进行化学强化的化学强化处理槽130，使得测定内径的玻璃基板的内径在化学品 加强步骤成为一个希望 ed值。 在化学强化步骤中，分别在确定的化学强化处理槽130中对玻璃基板102进行化学强化。
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9.发明授权Method of manufacturing glass substrate for magnetic disk and system for manufacturing glass substrate for magnetic disk 有权制造磁盘用玻璃基板的方法及制造用于磁盘的玻璃基板的系统公开(公告)号：US08640497B2
公开(公告)日：2014-02-04
申请号：US12525251
申请日：2008-01-24
申请人： Ryuuichi Kashima , Hideki Isono , Shinji Eda , Tomotaka Yokoyama , Tadashi Tomonaga , Kraisorn Phandon , Weeraphan Yayod
发明人： Ryuuichi Kashima , Hideki Isono , Shinji Eda , Tomotaka Yokoyama , Tadashi Tomonaga , Kraisorn Phandon , Weeraphan Yayod
IPC分类号： C03B15/00
CPC分类号： B24B9/08 , C03C21/002 , G11B5/8404
摘要： To provide a magnetic-disk glass substrate manufacturing method that can reduce the inner diameter dimensional error.A magnetic-disk glass substrate manufacturing method of this invention including a chemical strengthening step of bringing a plurality of glass substrates 102 into contact with chemical strengthening treatment solutions of a plurality of chemical strengthening treatment baths 130, respectively, to chemically strengthen the glass substrates further includes an inner diameter measuring step of measuring the inner diameter of each of the glass substrates 102 before the chemical strengthening step, a grasping step of grasping a variation of the inner diameter of the glass substrate 102 to be generated by the chemical strengthening step for each of the chemical strengthening treatment baths 130, and a combination determining step of determining the chemical strengthening treatment baths 130, that perform chemical strengthening, based on the variations so that the inner diameters of the glass substrates, whose inner diameters are measured, after the chemical strengthening step become a desired value. In the chemical strengthening step, the glass substrates 102 are chemically strengthened in the determined chemical strengthening treatment baths 130, respectively.
摘要翻译： 提供可以减小内径尺寸误差的磁盘玻璃基板的制造方法。 本发明的磁盘玻璃基板的制造方法包括使多个玻璃基板102分别与多个化学强化处理槽130的化学强化处理液接触的化学强化工序，以进一步化学强化玻璃基板 包括在化学强化步骤之前测量每个玻璃基板102的内径的内径测量步骤，抓取步骤，用于通过化学强化步骤获得要通过化学强化步骤产生的玻璃基板102的内径的变化 化学强化处理槽130的化学强化处理槽130的化学强化处理槽130的化学强化处理槽130的组合判定步骤，基于这些变化，进行化学强化的化学强化处理槽130，使得测定内径的玻璃基板的内径在化学品 加强步骤成为一个希望 ed值。 在化学强化步骤中，分别在确定的化学强化处理槽130中对玻璃基板102进行化学强化。
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10.发明申请公开(公告)号：US20110308073A1
公开(公告)日：2011-12-22
申请号：US13223060
申请日：2011-08-31
IPC分类号： G11B5/84
CPC分类号： G11B5/82 , B82Y10/00 , G11B5/743 , G11B5/8404 , G11B5/855
摘要： A defect inspection is performed for each of glass substrates by a surface defect detector. The distance from the center of the glass substrate to a detected defect, as a radius of a nonmagnetic region to be formed circular, is recorded along with an ID assigned to the glass substrate. Such defect information is recorded in a defect list using a printer or recorded in an RFID tag using an RFID writer. The defect list or the RFID tag is attached to a glass-substrate case. Each glass substrate and its defect information are in one-to-one correspondence and are provided to a customer as a magnetic disk manufacturer. Based on the obtained defect information, the customer manufactures magnetic disks each being a discrete track recording medium having the nonmagnetic region formed at the position where the defect is present.
摘要翻译： 通过表面缺陷检测器对玻璃基板进行缺陷检查。 将从玻璃基板的中心到检测到的缺陷的距离作为形成圆形的非磁性区域的半径与分配给玻璃基板的ID一起被记录。 使用打印机将这样的缺陷信息记录在缺陷列表中，或者使用RFID写入器记录在RFID标签中。 缺陷列表或RFID标签附着在玻璃基板外壳上。 每个玻璃基板及其缺陷信息是一一对应的，并作为磁盘制造商提供给客户。 基于获得的缺陷信息，客户制造磁盘，每个磁盘都是具有在存在缺陷的位置处形成的非磁性区域的离散轨道记录介质。
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