公开(公告)号：US4833403A

公开(公告)日：1989-05-23

申请号：US104883

申请日：1987-10-05

申请人： Toshio Tamamura ,  Akira Hoshika ,  Kiyoyasu Hiwada

发明人： Toshio Tamamura ,  Akira Hoshika ,  Kiyoyasu Hiwada

IPC分类号： G01R29/02 ,  G01R19/00 ,  G01R29/027 ,  G01R31/26

CPC分类号： G01R29/0276

摘要： A method and an apparatus for measuring settling characteristics of a device under test. A measurement system for measuring an input signal by sampling and digitizing that input signal is employed to obtain reference data by measuring a reference signal, at least one level of which is flat, and to obtain measurement data by measuring a second signal representing the settling characteristics to be measured but containing an error component due to inclusion of the measurement system itself. The error component is removed from the measurement data by adjusting the timing and level of the reference data relative to those of the measurement data.

摘要翻译： 一种用于测量被测设备的沉降特性的方法和装置。 采用通过对该输入信号进行采样和数字化来测量输入信号的测量系统，通过测量其至少一个电平是平坦的参考信号来获得参考数据，并且通过测量表示稳定特性的第二信号来获得测量数据 被测量但由于包含测量系统本身而包含误差分量。 通过调整参考数据的时间和电平相对于测量数据的时间和电平，从测量数据中去除误差分量。