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1.发明授权Method and apparatus for measuring settling characteristics of a device under test by using a measurement system for measuring an input signal by sampling and digitizing said input signal 失效通过使用测量系统来测量被测设备的稳定特性的方法和装置，用于通过采样和数字化所述输入信号来测量输入信号
公开(公告)号：US4833403A
公开(公告)日：1989-05-23
申请号：US104883
申请日：1987-10-05
申请人： Toshio Tamamura , Akira Hoshika , Kiyoyasu Hiwada
发明人： Toshio Tamamura , Akira Hoshika , Kiyoyasu Hiwada
IPC分类号： G01R29/02 , G01R19/00 , G01R29/027 , G01R31/26
CPC分类号： G01R29/0276
摘要： A method and an apparatus for measuring settling characteristics of a device under test. A measurement system for measuring an input signal by sampling and digitizing that input signal is employed to obtain reference data by measuring a reference signal, at least one level of which is flat, and to obtain measurement data by measuring a second signal representing the settling characteristics to be measured but containing an error component due to inclusion of the measurement system itself. The error component is removed from the measurement data by adjusting the timing and level of the reference data relative to those of the measurement data.
摘要翻译： 一种用于测量被测设备的沉降特性的方法和装置。 采用通过对该输入信号进行采样和数字化来测量输入信号的测量系统，通过测量其至少一个电平是平坦的参考信号来获得参考数据，并且通过测量表示稳定特性的第二信号来获得测量数据 被测量但由于包含测量系统本身而包含误差分量。 通过调整参考数据的时间和电平相对于测量数据的时间和电平，从测量数据中去除误差分量。
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公开(公告)号：US5051689A
公开(公告)日：1991-09-24
申请号：US510927
申请日：1990-04-19
申请人： Kiyoyasu Hiwada , Toshio Tamamura
发明人： Kiyoyasu Hiwada , Toshio Tamamura
CPC分类号： G01R1/07307 , G01R1/18
摘要： A test head comprising an electrically conductive cylindrical member for coupling to a device under test, a first path for connecting a first type of signal with the device under test, the first path being located outside the cylindrical member, and a second path for connecting a second type of signal with the device under test, the second path being located inside the cylindrical member, thereby preventing interference between signals of the first and second types. The first type of signal may be a digital signal and the second type of signal may be an analog signal.
摘要翻译： 一种测试头，包括用于耦合到被测设备的导电圆柱形构件，用于将第一类型信号与被测器件连接的第一路径，第一路径位于圆柱形构件外部，第二路径用于连接 第二类型的信号与被测器件相对，第二路径位于圆柱形部件内，从而防止第一和第二类型的信号之间的干扰。 第一类信号可以是数字信号，第二类信号可以是模拟信号。
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公开(公告)号：US4975639A
公开(公告)日：1990-12-04
申请号：US238711
申请日：1988-08-30
申请人： Kiyoyasu Hiwada , Toshio Tamamura
发明人： Kiyoyasu Hiwada , Toshio Tamamura
CPC分类号： G01R1/07307 , G01R1/18
摘要： A test head comprising an electrically conductive cylindrical member for coupling to a device under test, a first path for connecting a first type of signal with the device under test, the first path being located outside the cylindrical member, and a second path for connecting a second type of signal with the device under test, the second path being located inside the cylindrical member, hereby preventing interference between signals of the first and second types. The first type of signal may be a digital signal and the second type of signal may be an analog signal.
摘要翻译： 一种测试头，包括用于耦合到被测设备的导电圆柱形构件，用于将第一类型信号与被测器件连接的第一路径，第一路径位于圆柱形构件外部，第二路径用于连接 第二类型的信号与被测设备相对，第二路径位于圆柱形构件内，从而防止第一和第二类型的信号之间的干扰。 第一类信号可以是数字信号，第二类信号可以是模拟信号。
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4.发明授权Testing device and testing method for quantum battery using semiconductor probe 有权使用半导体探头的量子电池的测试装置和测试方法公开(公告)号：US09164149B2
公开(公告)日：2015-10-20
申请号：US14355329
申请日：2011-10-30
CPC分类号： G01R31/3637 , B82Y10/00 , G01R1/06744 , G01R31/3641 , G01R31/3665 , H01M10/48
摘要： This invention provide a testing device and method for a quantum battery by a semiconductor probe, whereby the electrical characteristics of the charging layer can be evaluated during the quantum battery manufacturing process. The testing device equipped with a semiconductor probe constituted by a conductive electrode and a metal oxide semiconductor layer including a metal oxide semiconductor which are laminated on a support, a source voltage for applying voltage across an electrode equipped to the semiconductor probe and a basic electrode laminated on a secondary battery charging layer, and an ammeter for measuring the current flowing between the electrode equipped on the semiconductor probe and the basic electrode of the secondary battery on which charging layer is laminated, and measures the current-voltage characteristics of the charging layer.
摘要翻译： 本发明通过半导体探针提供量子电池的测试装置和方法，由此可以在量子电池制造过程中评估充电层的电特性。 配备有由导电电极和层叠在支撑体上的包含金属氧化物半导体的金属氧化物半导体层构成的半导体探针的测试装置，层叠在半导体探针上的电极施加电压的源极电压和层叠 二次电池充电层和用于测量在半导体探针上配备的电极和层叠有充电层的二次电池的基极之间流动的电流的电流表，并测量充电层的电流 - 电压特性。
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公开(公告)号：US10036780B2
公开(公告)日：2018-07-31
申请号：US14342870
申请日：2011-09-05
申请人： Harutada Dewa , Kiyoyasu Hiwada
发明人： Harutada Dewa , Kiyoyasu Hiwada
CPC分类号： G01R31/385 , G01R1/07314 , G01R31/364 , G01R31/378 , H01M10/0436 , H01M10/48
摘要： An electrode probe is brought into contact with a measurement part on an outer surface of at least one of the positive electrode and the negative electrode of a sheet type cell, and quantity of electricity is measured at the measurement part, so as to evaluate the sheet type cell. The electrode probe may be connected to a voltage meter and to a charge source or a discharge source, and the evaluation made by detecting a charge characteristic that changes the cell from a non-charged state to a fully charged state, a discharge characteristic that changes the cell from a fully charged state to the non-charged state, or a measurement voltage of the voltage meter when the cell is in the fully charged state.
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公开(公告)号：US09865908B2
公开(公告)日：2018-01-09
申请号：US14406425
申请日：2012-06-06
申请人： Takuo Kudoh , Kiyoyasu Hiwada , Akira Nakazawa
发明人： Takuo Kudoh , Kiyoyasu Hiwada , Akira Nakazawa
CPC分类号： H01M14/005 , H01L31/022425 , H01L49/006 , H01M10/425 , H01M10/465 , H02J7/324
摘要： There is provided an electrode structure for preventing cracks occurring in a metal electrode due to heating in a manufacturing process in the case of stacking an insulating resin and the metal electrode which are different in thermal expansion coefficient. An electrode for a semiconductor circuit, stacked on a substrate made of an insulating resin, has an electrode structure composed of a main electrode including a slit formed by cutting out a part thereof to prevent occurrence of a crack in a manufacturing process caused by a difference in thermal expansion coefficient from the substrate, and an auxiliary electrode that covers the slit in the main electrode. No slit is provided but a bridge is formed at a portion where the slit in the main electrode and the slit in the auxiliary electrode overlap with each other, thereby eliminating a gap portion where the electrode does not exist.
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公开(公告)号：US09799927B2
公开(公告)日：2017-10-24
申请号：US14357856
申请日：2011-11-14
CPC分类号： H01M10/42 , H01L31/186 , H01L31/208 , H01M10/4242 , Y02E10/50 , Y02P70/521 , Y10T29/53135
摘要： A repair apparatus of a sheet type cell is capable of appropriately repairing and detoxifying defects of a sheet type cell having semiconductor characteristics. The repair apparatus repairs a sheet type cell in which a storage layer is sandwiched by layers of a positive electrode and a negative electrode and at least the storage layer has semiconductor characteristics. The repair apparatus applies electrical stimulation between the positive electrode and the negative electrode, measures electrical characteristics of the sheet type cell when the electrical stimulation is applied, and specifies a value of the electrical stimulation by the electrical stimulation source while considering measured electrical characteristics.
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公开(公告)号：US09778284B2
公开(公告)日：2017-10-03
申请号：US14404803
申请日：2012-05-31
申请人： Harutada Dewa , Kiyoyasu Hiwada , Akira Nakazawa
发明人： Harutada Dewa , Kiyoyasu Hiwada , Akira Nakazawa
CPC分类号： G01R1/067 , G01R1/06744 , G01R1/06761 , G01R31/3624 , G01R31/3665 , H01L22/14
摘要： A testing device and method of a quantum battery by a semiconductor probe capable of evaluating electric characteristics of a charge layer in the middle of a production process of the quantum battery without damaging the charge layer. On semiconductor probe constituted by stacking electrode and metal oxide semiconductor on support body, and probe charge layer is formed of the same material as that of quantum battery and irradiated with ultraviolet rays. Forming probe charge layer of same material as that of quantum battery on semiconductor probe enables evaluation without damaging charge layer of the quantum battery. Testing device and method are provided which measure the charge/discharge characteristics of a charge layer in the middle of producing the quantum battery by a voltmeter and a constant current source or a discharge resistor by using the semiconductor probe including the probe charge layer.
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公开(公告)号：US20150155608A1
公开(公告)日：2015-06-04
申请号：US14406425
申请日：2012-06-06
申请人： Takuo Kudoh , Kiyoyasu Hiwada , Akira Nakazawa
发明人： Takuo Kudoh , Kiyoyasu Hiwada , Akira Nakazawa
CPC分类号： H01M14/005 , H01L31/022425 , H01L49/006 , H01M10/425 , H01M10/465 , H02J7/324
摘要： There is provided an electrode structure for preventing cracks occurring in a metal electrode due to heating in a manufacturing process in the case of stacking an insulating resin and the metal electrode which are different in thermal expansion coefficient. An electrode for a semiconductor circuit, stacked on a substrate made of an insulating resin, has an electrode structure composed of a main electrode including a slit formed by cutting out a part thereof to prevent occurrence of a crack in a manufacturing process caused by a difference in thermal expansion coefficient from the substrate, and an auxiliary electrode that covers the slit in the main electrode. No slit is provided but a bridge is formed at a portion where the slit in the main electrode and the slit in the auxiliary electrode overlap with each other, thereby eliminating a gap portion where the electrode does not exist.
摘要翻译： 提供了一种电极结构，用于在叠层绝缘树脂和热膨胀系数不同的金属电极的情况下，在制造过程中由于加热而防止在金属电极中产生裂纹。 用于半导体电路的电极堆叠在由绝缘树脂制成的基板上，具有由主电极组成的电极结构，该主电极包括通过切除其一部分而形成的狭缝，以防止在由于差异引起的制造过程中产生裂缝 来自基板的热膨胀系数，以及覆盖主电极的狭缝的辅助电极。 没有设置狭缝，但是在主电极中的狭缝和辅助电极中的狭缝彼此重叠的部分处形成桥，从而消除不存在电极的间隙部分。
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公开(公告)号：US20150000119A1
公开(公告)日：2015-01-01
申请号：US14357856
申请日：2011-11-14
IPC分类号： H01M10/42
CPC分类号： H01M10/42 , H01L31/186 , H01L31/208 , H01M10/4242 , Y02E10/50 , Y02P70/521 , Y10T29/53135
摘要： A repair apparatus of a sheet type cell that is capable of appropriately repairing and detoxifying defects of a sheet type cell having semiconductor characteristics is provided.The repair apparatus repairs a sheet type cell in which a storage layer is sandwiched by layers of a positive electrode and a negative electrode and at least the storage layer has semiconductor characteristics. The repair apparatus includes an electrical stimulation source that applies electrical stimulation between the positive electrode and the negative electrode, an electrical characteristic measurement means that measures electrical characteristics of the sheet type cell when the electrical stimulation is applied, and a control means that specifies a value of the electrical stimulation by the electrical stimulation source while considering measured electrical characteristics.
摘要翻译： 提供一种片状电池的修复装置，其能够适当地修复和解毒具有半导体特性的片状电池的缺陷。 修理装置修复其中存储层被正极和负极的层夹在中的片状电池，并且至少存储层具有半导体特性。 所述修复装置包括在所述正极和所述负极之间施加电刺激的电刺激源，测定所述电刺激时所述片状电池的电特性的电特性测定单元，以及指定值 的电刺激源的电刺激，同时考虑测量的电特性。
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