Method and device for identifying defect opening profile

    公开(公告)号:US10788454B2

    公开(公告)日:2020-09-29

    申请号:US16044590

    申请日:2018-07-25

    Abstract: A method for identifying a defect opening profile includes: acquiring a vertical component of a magnetic flux leakage signal of a defect; identifying right-angle features and corresponding right-angle position points of the defect from the vertical component; obtaining all possible right-angle types at each right-angle position point of the defect according to the corresponding right-angle feature of the vertical component; traversing all the possible right-angle types at each right-angle position point to determine respective optimal right-angle type at each right-angle position point; and drawing the defect opening profile according to the respective optimal right-angle type at each right-angle position point.

    Method and device for testing defect based on ultrasonic lamb wave tomography

    公开(公告)号:US10197534B2

    公开(公告)日:2019-02-05

    申请号:US14948398

    申请日:2015-11-23

    Abstract: Disclosed are a method and a device for testing a defect based on an ultrasonic Lamb wave tomography. The method includes: partitioning an imaging area of a material to be tested into grids; exciting electromagnetic acoustic transducers for emitting to emit Lamb waves with a A0 mode in all directions, and electromagnetic acoustic transducers for receiving to receive the Lamb waves; obtaining a time-frequency analysis result and recording time-of-flights of testing waves; determining a first slowness of each grid to obtain a first defect area; establishing an extrapolation formula according to the first defect area, and iterating the extrapolation formula to trace and revise paths of the Lamb waves until a better imaging precision is obtained.

Patent Agency Ranking