NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
    1.
    发明申请
    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE 有权
    非易失性半导体存储器件

    公开(公告)号:US20100327253A1

    公开(公告)日:2010-12-30

    申请号:US12825975

    申请日:2010-06-29

    IPC分类号: H01L45/00

    摘要: According to one embodiment, a variable resistance layer includes a mixture of a first compound and a second compound. The first compound includes carbon (C) as well as at least one element selected from a group of elements G1. The group of elements G1 consists of hydrogen (H), boron (B), nitrogen (N), silicon (Si), and titanium (Ti). The second compound includes at least one compound selected from a group of compounds G2. The group of compounds G2 consists of silicon oxide (SiO2), silicon oxynitride (SiON), silicon nitride (Si3N4), carbon nitride (C3N4), boron nitride (BN), aluminum nitride (AlN), aluminum oxide (Al2O3), and silicon carbide (SiC). Concentration of the first compound in the variable resistance layer is not less than 30 volume percent, and not more than 70 volume percent.

    摘要翻译: 根据一个实施方案,可变电阻层包括第一化合物和第二化合物的混合物。 第一化合物包括碳(C)以及选自元素组G1的至少一种元素。 元素组G1由氢(H),硼(B),氮(N),硅(Si)和钛(Ti)组成。 第二化合物包括选自化合物G2的至少一种化合物。 化合物组G2由氧化硅(SiO 2),氮氧化硅(SiON),氮化硅(Si 3 N 4),碳氮化物(C 3 N 4),氮化硼(BN),氮化铝(AlN),氧化铝(Al 2 O 3)和 碳化硅(SiC)。 可变电阻层中第一化合物的浓度不小于30体积%,不大于70体积%。