Integrated electronic hardware for wafer processing control and diagnostic
    1.
    发明授权
    Integrated electronic hardware for wafer processing control and diagnostic 有权
    用于晶圆处理控制和诊断的集成电子硬件

    公开(公告)号:US06622286B1

    公开(公告)日:2003-09-16

    申请号:US09608599

    申请日:2000-06-30

    IPC分类号: G06F1750

    摘要: A central controller for use in a semiconductor manufacturing equipment integrates a plurality of controllers with an open architecture allowing real-time communication between the various control loops. The central controller includes at least one central processing unit (CPU) executing high level input output (i/o) and control algorithms and at least one integrated i/o controller providing integrated interface to sensors and control hardware. The integrated i/o controller performs basic i/o and low level control functions and communicates with the CPU through a bus to perform or enable controls of various subsystems of the semiconductor manufacturing equipment.

    摘要翻译: 用于半导体制造设备的中央控制器将多个控制器与允许各种控制回路之间的实时通信的开放架构集成。 中央控制器包括执行高电平输入输出(i / o)和控制算法的至少一个中央处理单元(CPU)以及提供与传感器和控制硬件的集成接口的至少一个集成i / o控制器。 集成i / o控制器执行基本的I / O和低级控制功能,并通过总线与CPU进行通信,以执行或启用对半导体制造设备的各种子系统的控制。