Semiconductor wafer with process control modules
    1.
    发明申请
    Semiconductor wafer with process control modules 有权
    具有过程控制模块的半导体晶圆

    公开(公告)号:US20020117735A1

    公开(公告)日:2002-08-29

    申请号:US10081893

    申请日:2002-02-21

    CPC classification number: H01L22/34

    Abstract: A semiconductor wafer (1) has a multitude of chips (5), of which chips (5) each one of a given number of chips (5) is situated in one of a multitude of adjacent exposure fields (2), and further has process control modules (4) which are each arranged in an exposure field (2), namely each in place of at least one chip (5).

    Abstract translation: 半导体晶片(1)具有多个芯片(5),其中给定数量的芯片(5)中的每一个的芯片(5)位于多个相邻曝光区域(2)中的一个中,并且还具有 处理控制模块(4),其分别布置在曝光区域(2)中,即各自代替至少一个芯片(5)。

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