SAMPLE HOLDER FOR AN ATOMIC FORCE MICROSCOPE
    2.
    发明申请
    SAMPLE HOLDER FOR AN ATOMIC FORCE MICROSCOPE 有权
    原子力显微镜样品座

    公开(公告)号:US20160187375A1

    公开(公告)日:2016-06-30

    申请号:US14902608

    申请日:2014-07-05

    CPC classification number: G01Q30/20 A61B10/0233 G01Q60/24

    Abstract: The present invention relates to sample holders for holding a sample, particularly for an atomic force microscope. Such a sample holder comprising a sample dish (1) comprising a bottom (2), and an opening (3) arranged in said bottom (2) for receiving and holding the sample (15). Furthermore the present invention relates to a sample holder system and to a method for transferring an e.g. biological sample (15) from a biopsy tool (18) to a sample holder.

    Abstract translation: 本发明涉及用于保持样品的样品保持器,特别是用于原子力显微镜。 这种样品保持器包括包括底部(2)的样品皿(1)和布置在所述底部(2)中用于接收和保持样品(15)的开口(3)。 此外,本发明涉及一种样品保持器系统和一种用于转移例如, 生物样品(15)从活检工具(18)到样品架。

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