公开(公告)号：US11860187B2

公开(公告)日：2024-01-02

申请号：US17280552

申请日：2020-09-07

申请人： DALIAN UNIVERSITY OF TECHNOLOGY

发明人： Wei Zhang ,  Weihao Sun ,  Chengwei Wu ,  Jianli Ma

IPC分类号： G01Q60/28 ,  G06F30/23 ,  G01N15/10 ,  G01Q60/24 ,  G01Q30/04 ,  G01Q60/36 ,  G06F119/14

CPC分类号： G01Q60/28 ,  G01N15/10 ,  G01Q30/04 ,  G01Q60/366 ,  G06F30/23 ,  G01Q60/24 ,  G06F2119/14

摘要： This invention belongs to the technical field of cell mechanics and provides a modified method to fit cell elastic modulus based on Sneddon model. The process of the conical atomic force microscope probe compressing into the cell was simulated by ABAQUS. The simulation results are compared with the Sneddon model to get the error caused by Sneddon model. The fitting errors of Sneddon model under different circumstances were obtained by using the method of function fitting, so as to realize the modification of Sneddon model to fit cell elastic modulus. As a modified method to fit cell elastic modulus based on Sneddon model, it can be used to measure the elastic modulus of cells more accurately. The design process is convenient and fast. The design method is easy to master, and the process of use is convenient and simple.

公开(公告)号：US09902027B2

公开(公告)日：2018-02-27

申请号：US14908809

申请日：2014-08-01

申请人： Hysitron, Inc.

发明人： Rajiv Dama ,  Svetlana Zigelman

IPC分类号： G01D21/00 ,  B23P19/04 ,  G01N3/42 ,  G01Q60/36 ,  G01Q70/02 ,  B23P19/10 ,  G01D18/00 ,  G01N19/04

CPC分类号： B23P19/04 ,  B23P19/10 ,  G01D18/00 ,  G01N3/42 ,  G01N19/04 ,  G01N2203/0078 ,  G01N2203/0202 ,  G01N2203/0206 ,  G01N2203/0286 ,  G01Q60/366 ,  G01Q70/02

摘要： An instrument changing assembly includes a magazine having one or more probe assembly stations. The assembly further includes at least one probe change tool including a receptacle socket. One or more probe assemblies are retained within the one or more probe assembly stations. The one or more probe assemblies each include a probe receptacle including a probe retention recess and a common socket fitting configured for complementary fitting with a common receptacle socket. The probe change tool is configured to install or extract the respective probes from a mechanical testing instrument according to the complementary fit between the common socket fitting and the common receptacle socket of the probe assemblies. Alternatively, the instrument changing assembly includes an instrument array housing including a plurality of instruments. Each of the one or more instruments (probe and transducer combination) are deployed relative to the instrument array housing with an instrument deployment actuator.

公开(公告)号：US09885691B1

公开(公告)日：2018-02-06

申请号：US15664251

申请日：2017-07-31

申请人： Nanometronix LLC

发明人： Antanas Daugela

IPC分类号： G01N29/24

CPC分类号： G01N29/2437 ,  G01N3/405 ,  G01N3/42 ,  G01N29/09 ,  G01N29/221 ,  G01N29/2462 ,  G01N29/2487 ,  G01N29/4436 ,  G01N2203/0286 ,  G01N2291/018 ,  G01Q60/366

摘要： A multimode ultrasonic probe tip and transducer integrated into a micro tool, such as a nano indenter or a nano indenter interfaced with a Scanning Probe Microscope (SPM) is described. The tip component may be utilized to determine mechanical properties or characteristics of a sample, including for example, complex elastic modulus, hardness, friction coefficient, and strain and stress at nanometer scales and high frequencies. The tip component is configured to operate at multi-resonant frequencies providing sub-nanometer vertical resolution. The tip component may be quasi-statistically calibrated and contact mechanics constitutive equations may be utilized to derive mechanical properties of a sample. Contact mechanical impedance and acoustic impedance may also be compared.

公开(公告)号：US09588327B2

公开(公告)日：2017-03-07

申请号：US14537096

申请日：2014-11-10

申请人： The Board of Trustees of the University of Illinois

发明人： Kimani Toussaint ,  Placid Ferreira ,  Amy Wagoner Johnson ,  William Wilson

IPC分类号： G01L1/24 ,  G02B21/04 ,  G01Q30/02 ,  G01Q60/36

CPC分类号： G02B21/04 ,  G01Q30/025 ,  G01Q60/366

摘要： Methods and apparatus for characterizing a sample in situ as to both its mechanical and optical characteristics. The apparatus comprises a reflective microscope with a concave primary mirror and a convex secondary mirror sharing a common optical axis, and an actuator vignetted by the convex secondary mirror for applying a force to a nanoprobe in a direction having a component along the common optical axis. The apparatus may addition include a source for generating an illuminating beam, a detector, and a processor for forming an image based on a signal provided by the detector.

摘要翻译： 用于将样品原位表征其机械和光学特性的方法和装置。 该装置包括具有凹面主镜和共享共同光轴的凸面次级反射镜的反射显微镜，以及由凸面辅镜反射的致动器，用于沿具有沿共同光轴的分量的方向向纳米探针施加力。 该装置还可以包括用于产生照明光束的源，检测器和用于基于由检测器提供的信号形成图像的处理器。

公开(公告)号：US09535086B2

公开(公告)日：2017-01-03

申请号：US14742105

申请日：2015-06-17

申请人： FEMTOTOOLS AG

发明人： Felix Beyeler ,  Simon Muntwyler

IPC分类号： G01Q20/00 ,  B81C99/00 ,  G01Q20/04 ,  G01Q60/36 ,  G01N3/42 ,  G01L1/14 ,  G01L5/00 ,  G01Q10/04

CPC分类号： G01Q20/00 ,  B81C99/005 ,  G01L1/148 ,  G01L5/0038 ,  G01N3/42 ,  G01N2203/0286 ,  G01Q10/045 ,  G01Q20/04 ,  G01Q60/366

摘要： A micro fabricated sensor for micro-mechanical and nano-mechanical testing and nano-indentation. The sensor includes a force sensing capacitive comb drive for the sensing of a force applied to a sample, a position sensing capacitive comb drive for the sensing of the position of a sample and a micro fabricated actuator to apply a load to the sample. All the sensor components mentioned above are monolithically integrated on the same silicon MEMS chip.

摘要翻译： 一种用于微机械和纳米机械测试和纳米压痕的微型制造传感器。 传感器包括用于感测施加到样本的力的力感测电容梳驱动器，用于感测样品位置的感测位置感应电容梳驱动器和微制造致动器以向样品施加负载。 上述所有传感器组件都是单片集成在同一个硅MEMS芯片上。

公开(公告)号：US20160169718A1

公开(公告)日：2016-06-16

申请号：US14908809

申请日：2014-08-01

申请人： HYSITRON, INC.

发明人： Rajiv Dama ,  Svetlana Zigelman

IPC分类号： G01D18/00 ,  B23P19/04 ,  B23P19/10

CPC分类号： B23P19/04 ,  B23P19/10 ,  G01D18/00 ,  G01N3/42 ,  G01N19/04 ,  G01N2203/0078 ,  G01N2203/0202 ,  G01N2203/0206 ,  G01N2203/0286 ,  G01Q60/366 ,  G01Q70/02

摘要： An instrument changing assembly includes a magazine having one or more probe assembly stations. The assembly further includes at least one probe change tool including a receptacle socket. One or more probe assemblies are retained within the one or more probe assembly stations. The one or more probe assemblies each include a probe receptacle including a probe retention recess and a common socket fitting configured for complementary fitting with a common receptacle socket. The probe change tool is configured to install or extract the respective probes from a mechanical testing instrument according to the complementary fit between the common socket fitting and the common receptacle socket of the probe assemblies. Alternatively, the instrument changing assembly includes an instrument array housing including a plurality of instruments. Each of the one or more instruments (probe and transducer combination) are deployed relative to the instrument array housing with an instrument deployment actuator.

摘要翻译： 仪器更换组件包括具有一个或多个探针组装工位的盒。 组件还包括至少一个探针更换工具，其包括插座插座。 一个或多个探针组件保持在一个或多个探针组装工位内。 一个或多个探针组件各自包括探针插座，其包括探针保持凹部和构造成用于与公共插座插座互补配合的公共插座配件。 探头更换工具被配置为根据公共插座配件和探头组件的公共插座之间的互补配合从机械测试仪器安装或提取相应的探头。 或者，仪器更换组件包括包括多个仪器的仪器阵列壳体。 一个或多个仪器（探头和换能器组合）中的每一个相对于具有仪器部署致动器的仪器阵列壳体被部署。

公开(公告)号：US08770036B2

公开(公告)日：2014-07-08

申请号：US13962865

申请日：2013-08-08

申请人： Hysitron, Inc.

发明人： David James Vodnick ,  Arpit Dwivedi ,  Lucas Paul Keranen ,  Michael David Okerlund ,  Roger William Schmitz ,  Oden Lee Warren ,  Christopher David Young

IPC分类号： G01N3/00

CPC分类号： G01P21/00 ,  G01B11/27 ,  G01B21/047 ,  G01N3/02 ,  G01N3/42 ,  G01N19/00 ,  G01N2203/0082 ,  G01N2203/0286 ,  G01Q40/00 ,  G01Q60/366 ,  Y10T29/49826

摘要： An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

摘要翻译： 自动化测试系统包括用机械测试仪器，以微（多微米）或更小尺度促进样品在线生产测试的系统和方法。 在一个示例中，该系统包括用于耦合和去耦器械的探针的探针更换组件。 探针更换组件包括探针改变单元，其被配置为抓住探针盒中的多个探针中的一个探针并将一个探针与仪器探针插座相耦合。 致动器与探头更换单元联接，并且致动器构造成使探针更换单元与探针盒和仪器探针插座移动和对准。 在另一示例中，自动化测试系统包括用于使样本测试位置与仪器对准的多自由度级。 舞台包括样本台和包括平移和旋转致动器的舞台致动器组件。

公开(公告)号：US08590061B1

公开(公告)日：2013-11-19

申请号：US13425456

申请日：2012-03-21

申请人： Qingze Zou ,  Zhonghua Xu

发明人： Qingze Zou ,  Zhonghua Xu

IPC分类号： G01Q10/06

CPC分类号： G01Q30/04 ,  G01Q60/366

摘要： An optimal input design method and apparatus to achieve rapid broadband nanomechanical measurements of soft materials using the indentation-based method for the investigation of fast evolving phenomenon, such as the crystallization process of polymers, the nanomechanical measurement of live cell during cell movement, and force volume mapping of nonhomogeneous materials, are presented. The indentation-based nanomechanical measurement provides unique quantification of material properties at specified locations. Particularly, an input force profile with discrete spectrum is optimized to maximize the Fisher information matrix of the linear compliance model of the soft material.

摘要翻译： 使用基于压痕的方法快速演化现象的研究，如聚合物的结晶过程，细胞运动过程中活细胞的纳米力学测量以及力作用，实现软材料快速宽带纳米力学测量的最佳输入设计方法和装置 介绍了非均匀材料的体积映射。 基于压痕的纳米机械测量提供了在指定位置的材料特性的独特定量。 特别地，具有离散频谱的输入力分布被优化以使软材料的线性一致性模型的Fisher信息矩阵最大化。

公开(公告)号：US08453498B2

公开(公告)日：2013-06-04

申请号：US12886745

申请日：2010-09-21

申请人： Oden L. Warren ,  Syed Amanula Syed Asif ,  Edward Cyrankowski ,  Kalin Kounev

发明人： Oden L. Warren ,  Syed Amanula Syed Asif ,  Edward Cyrankowski ,  Kalin Kounev

IPC分类号： G01B5/28 ,  G01B7/16 ,  G01L1/00

CPC分类号： G01B7/22 ,  G01D5/2417 ,  G01N3/42 ,  G01N2203/0051 ,  G01N2203/0286 ,  G01N2203/0617 ,  G01Q30/02 ,  G01Q60/366 ,  H01J2237/20264 ,  H02N1/002

摘要： An actuatable capacitive transducer including a transducer body, a first capacitor including a displaceable electrode and electrically configured as an electrostatic actuator, and a second capacitor including a displaceable electrode and electrically configured as a capacitive displacement sensor, wherein the second capacitor comprises a multi-plate capacitor. The actuatable capacitive transducer further includes a coupling shaft configured to mechanically couple the displaceable electrode of the first capacitor to the displaceable electrode of the second capacitor to form a displaceable electrode unit which is displaceable relative to the transducer body, and an electrically-conductive indenter mechanically coupled to the coupling shaft so as to be displaceable in unison with the displaceable electrode unit.

摘要翻译： 一种可启动电容换能器，包括换能器主体，包括可置换电极并被电气配置为静电致动器的第一电容器和包括可置换电极并被电气配置为电容位移传感器的第二电容器，其中所述第二电容器包括多板 电容器。 可致动电容换能器还包括联接轴，其被配置为将第一电容器的可移动电极机械耦合到第二电容器的可移动电极，以形成相对于换能器本体可位移的可移位电极单元，以及机械地 耦合到联接轴，以便与可移位电极单元一致地移动。

公开(公告)号：US20130098145A1

公开(公告)日：2013-04-25

申请号：US13688034

申请日：2012-11-28

申请人： Hysitron Incorporated

发明人： Yunje Oh ,  Ryan Major ,  Douglas Stauffer ,  Syed Amanula Syed Asif

IPC分类号： G01N3/42

CPC分类号： G01N3/42 ,  B82Y35/00 ,  G01N2203/0051 ,  G01N2203/0286 ,  G01N2203/0617 ,  G01Q60/366

摘要： A system and method of measuring an interaction force is disclosed. One embodiment includes providing a method of measuring an interaction force including providing a microelectromechanical transducer. The transducer includes a body, a probe moveable relative to the body, and a micromachined comb drive. The micromachined comb drive includes a differential capacitive displacement sensor to provide a sensor output signal representative of an interaction force on the probe. The probe is moved relative to a sample surface. An interaction force is determined between the probe and the sample surface using the sensor output, as the probe is moved relative to the sample surface.

摘要翻译： 公开了一种测量相互作用力的系统和方法。 一个实施例包括提供测量相互作用力的方法，包括提供微机电换能器。 换能器包括主体，可相对于主体移动的探头以及微机械梳状驱动器。 微加工梳状驱动器包括差分电容位移传感器，以提供表示探针上的相互作用力的传感器输出信号。 探针相对于样品表面移动。 当探针相对于样品表面移动时，使用传感器输出在探针和样品表面之间确定相互作用力。