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公开(公告)号：US11933676B2
公开(公告)日：2024-03-19
申请号：US17429834
申请日：2020-02-14
CPC分类号： G01J9/00 , G02B21/06 , G02B21/365
摘要： The present invention relates to a microscope for quantitative measurements of the wavefront, comprising:
means for the illumination of a sample (T);
an objective lens (2);
an ordered two-dimensional arrangement of lenses (3), with a spacing pμ greater than 500 μm and a relative aperture of less than 10;
an image sensor (4) located in a capture space (Ec) to receive the light scattered by the sample (T), and to acquire spatial and angular information on the object wavefront associated therewith; and
a computational entity to perform a computational reconstruction of the object wavefront from the spatial and angular information.
Other aspects of the invention relate to a method, a computer program and a product incorporating the same, adapted for the performance of the functions of the computational entity of the microscope, as well as to a module and a kit for a microscope.
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