公开(公告)号：US11579178B1

公开(公告)日：2023-02-14

申请号：US17647012

申请日：2022-01-04

Applicant: Unimicron Technology Corp.

Inventor： Hsin-Hung Lee ,  Chun-Hsien Chien ,  Yu-Chung Hsieh ,  Yi-Hsiu Fang ,  Tzyy-Jang Tseng

IPC: G01R29/08

Abstract: An inspection apparatus used for inspecting a bare circuit board is provided, where the bare circuit board includes an antenna. The inspection apparatus includes a holding stage, a probing device, and a measurement device. The holding stage can hold the bare circuit board. The measurement device is electrically connected to the probing device and electrically connected to the antenna via the probing device. The measurement device can input a first testing signal to the antenna. The antenna can input a second testing signal to the measurement device after receiving the first testing signal. The measurement device can measure the antenna according to the second testing signal, where the first testing signal and the second testing signal both pass through no active component.