TESTKEY STRUCTURE AND MONITORING METHOD WITH TESTKEY STRUCTURE

    公开(公告)号:US20230402329A1

    公开(公告)日:2023-12-14

    申请号:US17873189

    申请日:2022-07-26

    CPC classification number: H01L22/14 H01L22/34 G01R31/2884

    Abstract: The present disclosure provides a testkey structure and a monitoring method with a testkey structure, and the testkey structure includes a first diffusion region and a second diffusion region, a first gate and a second gate, a first epitaxial layer and a second epitaxial layer, and an input pad and an output pad. The first diffusion region and the second diffusion region are disposed in a substrate. The first gate and the second gate are disposed on a substrate, across the first diffusion region and the second diffusion region respectively. The first epitaxial layer and the second epitaxial layer are respectively disposed on the second diffusion region and the first diffusion region, separately disposed between the first gate and the second gate. The input pad and the output pad are electrically connected to the first epitaxial layer and the second epitaxial layer respectively.

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