-
1.
公开(公告)号:US11775693B1
公开(公告)日:2023-10-03
申请号:US17543034
申请日:2021-12-06
Inventor: Prabhat Kumar Mishra , Jennifer Marie Sheldon , Zhixin Pan
IPC: G06F21/76 , G06F21/54 , G06F30/333 , G06F21/55 , G06N3/08
CPC classification number: G06F21/76 , G06F21/54 , G06F21/554 , G06F21/556 , G06F30/333 , G06N3/08
Abstract: The present disclosure describes systems and methods for test pattern generation to detect a hardware Trojan using delay-based analysis. One such method comprises determining a set of initial test patterns to activate the hardware Trojan within an integrated circuit design; and generating a set of succeeding test patterns to activate the hardware Trojan within the integrated circuit design using a reinforcement learning model. The set of initial test patterns can be applied as an input to the reinforcement learning model. Further, the reinforcement learning model can be trained with a stochastic learning scheme to increase a probability of triggering one or more rare nodes in the integrated circuit design and identify optimal test vectors to maximize delay-based side-channel sensitivity when the hardware Trojan is activated in the integrated circuit design. Other methods and systems are also provided.