Hardware trojan detection using reinforcement learning

    公开(公告)号:US12079334B2

    公开(公告)日:2024-09-03

    申请号:US17543940

    申请日:2021-12-07

    CPC classification number: G06F21/554 G06N20/00 G06F2221/034

    Abstract: The present disclosure provides systems and methods for test pattern generation to detect a hardware Trojan. One such method includes determining, by a computing device, a set of initial test patterns to activate the hardware Trojan within an integrated circuit design; evaluating nodes of the integrated circuit design and assigning a rareness attribute value and a testability attribute value associated with respective nodes of the integrated circuit design; and generating a set of additional test patterns to activate the hardware Trojan within the integrated circuit design using a reinforcement learning model. The set of initial test patterns is applied as an input along with rareness attribute values and testability attribute values associated with the nodes of the integrated circuit, and the reinforcement learning model is trained with a stochastic learning scheme to identify optimal test patterns for triggering nodes of the integrated circuit design.

    HARDWARE TROJAN DETECTION USING REINFORCEMENT LEARNING

    公开(公告)号:US20220188415A1

    公开(公告)日:2022-06-16

    申请号:US17543940

    申请日:2021-12-07

    Abstract: The present disclosure provides systems and methods for test pattern generation to detect a hardware Trojan. One such method includes determining, by a computing device, a set of initial test patterns to activate the hardware Trojan within an integrated circuit design; evaluating nodes of the integrated circuit design and assigning a rareness attribute value and a testability attribute value associated with respective nodes of the integrated circuit design; and generating a set of additional test patterns to activate the hardware Trojan within the integrated circuit design using a reinforcement learning model. The set of initial test patterns is applied as an input along with rareness attribute values and testability attribute values associated with the nodes of the integrated circuit, and the reinforcement learning model is trained with a stochastic learning scheme to identify optimal test patterns for triggering nodes of the integrated circuit design.

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