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公开(公告)号：US09746435B2
公开(公告)日：2017-08-29
申请号：US14475327
申请日：2014-09-02
摘要： A nondestructive inspection apparatus of a structure includes: an inspection apparatus body 1 provided with an infrared light irradiation unit irradiating a structure 3 to be inspected with heating infrared light, a temperature variation measuring unit measuring a variation in temperature of the structure due to the irradiation with infrared light from the infrared light irradiation unit, a drive-control-and-accumulation unit performing drive control of the infrared light irradiation unit and the temperature variation measuring unit and performing data accumulation; and a self-running mechanism unit 2 enabling the inspection apparatus body 1 to move along the structure 3. The structure 3 is inspected for an internal defect by irradiating the structure 3 with heating infrared light while the apparatus moves along the structure 3 through the use of the self-running mechanism unit 2 and measuring the variation in temperature of the structure 3 due to the irradiation with infrared light.
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公开(公告)号：US20160149070A1
公开(公告)日：2016-05-26
申请号：US14899179
申请日：2014-04-23
发明人： Koichi Kajiyama , Yoshinori Ogawa
IPC分类号： H01L31/103 , H01L31/0224 , H01L31/18
CPC分类号： H01L31/103 , H01L31/0224 , H01L31/022408 , H01L31/18
摘要： A light-receiving element includes a semiconductor layer with a pn junction part and a pair of electrodes that interpose the pn junction part. Near field light is generated in the vicinity of the pn junction part by applying a forward bias voltage between the pair of electrodes and irradiating the pn junction with light that has a specific wavelength, and an electrode of the irradiated pair of electrodes is configured with a wire grid polarizer that transmits the light that has the specific wavelength.
摘要翻译： 光接收元件包括具有pn结部分的半导体层和插入pn结部分的一对电极。 通过在一对电极之间施加正向偏压并用pn结照射具有特定波长的光，在pn结部附近产生近场光，照射的一对电极的电极配置为 线栅偏振器，透射具有特定波长的光。
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