公开(公告)号：US20160245599A2

公开(公告)日：2016-08-25

申请号：US14649542

申请日：2013-11-25

Applicant: Valmet Technologies Oy

Inventor： Joni Maunula

IPC: F28G15/00 ,  G01B11/06

CPC classification number: F28G15/003 ,  F23J3/023 ,  F23M11/042 ,  G01B11/0616 ,  G01B11/0625

Abstract: An arrangement of a thermal device and a surface reflecting and/or scattering electromagnetic radiation in the inner part of the thermal device. A source of electromagnetic radiation is arranged at a first distance (L1) from the surface, and a detector of electromagnetic radiation is arranged at a second distance (L2) from the surface. The source is configured to emit radiation to the surface, which is reflected and/or scattered from the surface as reflected radiation. The detector receives reflected radiation; and the processing unit determines data dependent on the first and/or second distance by the emitted and reflected radiation. A wall of the thermal device has a window or aperture for emitting an optical signal from the light source to the surface. An electromagnetic distance measurement device measures the thickness or the increase in the thickness of a contamination layer from a thermal device.

公开(公告)号：US09739547B2

公开(公告)日：2017-08-22

申请号：US14649542

申请日：2013-11-25

Applicant: Valmet Technologies Oy

Inventor： Joni Maunula

IPC: G01B11/06 ,  F28G15/00 ,  F23M11/04 ,  F23J3/02

CPC classification number: F28G15/003 ,  F23J3/023 ,  F23M11/042 ,  G01B11/0616 ,  G01B11/0625

Abstract: An arrangement of a thermal device and a surface reflecting and/or scattering electromagnetic radiation in the inner part of the thermal device. A source of electromagnetic radiation is arranged at a first distance (L1) from the surface, and a detector of electromagnetic radiation is arranged at a second distance (L2) from the surface. The source is configured to emit radiation to the surface, which is reflected and/or scattered from the surface as reflected radiation. The detector receives reflected radiation; and the processing unit determines data dependent on the first and/or second distance by the emitted and reflected radiation. A wall of the thermal device has a window or aperture for emitting an optical signal from the light source to the surface. An electromagnetic distance measurement device measures the thickness or the increase in the thickness of a contamination layer from a thermal device.

公开(公告)号：US20150369549A1

公开(公告)日：2015-12-24

申请号：US14649542

申请日：2013-11-25

Applicant: VALMET TECHNOLOGIES OY

Inventor： Joni Maunula

IPC: F28G15/00 ,  G01B11/06

CPC classification number: F28G15/003 ,  F23J3/023 ,  F23M11/042 ,  G01B11/0616 ,  G01B11/0625

Abstract: An arrangement of a thermal device and a surface reflecting and/or scattering electromagnetic radiation in the inner part of the thermal device. A source of electromagnetic radiation is arranged at a first distance (L1) from the surface, and a detector of electromagnetic radiation is arranged at a second distance (L2) from the surface. The source is configured to emit radiation to the surface, which is reflected and/or scattered from the surface as reflected radiation. The detector receives reflected radiation; and the processing unit determines data dependent on the first and/or second distance by the emitted and reflected radiation. A wall of the thermal device has a window or aperture for emitting an optical signal from the light source to the surface. An electromagnetic distance measurement device measures the thickness or the increase in the thickness of a contamination layer from a thermal device.

Abstract translation: 在热装置的内部部分中的热装置和表面反射和/或散射电磁辐射的布置。 电磁辐射源被布置在离表面的第一距离（L1）处，并且电磁辐射检测器被布置在离表面的第二距离（L2）处。 源被配置为向表面发射辐射，其作为反射辐射从表面反射和/或散射。 检测器接收反射辐射; 并且处理单元通过发射和反射的辐射确定取决于第一和/或第二距离的数据。 热装置的壁具有用于从光源向表面发射光信号的窗口或孔。 电磁距离测量装置测量来自热装置的污染层的厚度或厚度的增加。