REDUCING THE EFFECT OF PARASITIC MISMATCH AT AMPLIFIER INPUTS
    1.
    发明申请
    REDUCING THE EFFECT OF PARASITIC MISMATCH AT AMPLIFIER INPUTS 有权
    降低放大器输入中PARASITIC MISMATCH的影响

    公开(公告)号:US20140085003A1

    公开(公告)日:2014-03-27

    申请号:US13629123

    申请日:2012-09-27

    Applicant: Xilinx, Inc.

    CPC classification number: H03F3/45 H03F1/56 Y10T29/49002

    Abstract: A circuit includes an amplifier including a differential input stage including a first input terminal and a second input terminal. The circuit further includes a differential input line coupled to the first input terminal and the second input terminal, and shielding at least partially encompassing the differential input line. The shielding is connected to a node of the differential input stage of the amplifier.

    Abstract translation: 电路包括放大器,其包括具有第一输入端和第二输入端的差分输入级。 电路还包括耦合到第一输入端和第二输入端的差分输入线,以及至少部分地包围差分输入线的屏蔽。 屏蔽连接到放大器差分输入级的一个节点。

    Reducing the effect of parasitic mismatch at amplifier inputs
    2.
    发明授权
    Reducing the effect of parasitic mismatch at amplifier inputs 有权
    降低放大器输入端寄生失配的影响

    公开(公告)号:US08902004B2

    公开(公告)日:2014-12-02

    申请号:US13629123

    申请日:2012-09-27

    Applicant: Xilinx, Inc.

    CPC classification number: H03F3/45 H03F1/56 Y10T29/49002

    Abstract: A circuit includes an amplifier including a differential input stage including a first input terminal and a second input terminal. The circuit further includes a differential input line coupled to the first input terminal and the second input terminal, and shielding at least partially encompassing the differential input line. The shielding is connected to a node of the differential input stage of the amplifier.

    Abstract translation: 电路包括放大器,其包括具有第一输入端和第二输入端的差分输入级。 电路还包括耦合到第一输入端和第二输入端的差分输入线,以及至少部分地包围差分输入线的屏蔽。 屏蔽连接到放大器差分输入级的一个节点。

    Dynamic element matching in an integrated circuit

    公开(公告)号:US10545053B2

    公开(公告)日:2020-01-28

    申请号:US15616765

    申请日:2017-06-07

    Applicant: Xilinx, Inc.

    Abstract: An example dynamic element matching (DEM) circuit includes: a plurality of bipolar junction transistors (BJTs), each of the plurality of BJTs having a base terminal and a collector terminal coupled to electrical ground; a plurality of pairs of force switches, each pair of force switches coupled to an emitter of a respective one of the plurality of BJTs; a plurality of pairs of sense switches, where each pair of sense switches is coupled to the emitter of a respective one of the plurality of BJTs, a first switch in each pair of sense switches is coupled to a first node, and a second switch in each pair of sense switches is coupled to a second node; a first current source coupled to a first switch in each pair of force switches; and a second current source coupled to a second switch in each pair of force switches.

    DYNAMIC ELEMENT MATCHING IN AN INTEGRATED CIRCUIT

    公开(公告)号:US20180356294A1

    公开(公告)日:2018-12-13

    申请号:US15616765

    申请日:2017-06-07

    Applicant: Xilinx, Inc.

    Abstract: An example dynamic element matching (DEM) circuit includes: a plurality of bipolar junction transistors (BJTs), each of the plurality of BJTs having a base terminal and a collector terminal coupled to electrical ground; a plurality of pairs of force switches, each pair of force switches coupled to an emitter of a respective one of the plurality of BJTs; a plurality of pairs of sense switches, where each pair of sense switches is coupled to the emitter of a respective one of the plurality of BJTs, a first switch in each pair of sense switches is coupled to a first node, and a second switch in each pair of sense switches is coupled to a second node; a first current source coupled to a first switch in each pair of force switches; and a second current source coupled to a second switch in each pair of force switches.

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