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8 条记录 (耗时 0.018 秒)

    WIRING FAULT DETECTION METHOD AND WIRING FAULT DETECTION APPARATUS
    7.
    发明申请
    WIRING FAULT DETECTION METHOD AND WIRING FAULT DETECTION APPARATUS 审中-公开
    接线故障检测方法及接线故障检测装置

    公开(公告)号：US20140203815A1

    公开(公告)日：2014-07-24

    申请号：US14236980

    申请日：2012-09-10

    申请人： Masakazu Yanase

    发明人： Masakazu Yanase

    IPC分类号： G01R1/07

    CPC分类号： G01R1/071 ,  G01R31/308 ,  G09G3/006 ,  G09G3/36

    摘要： A wiring fault detection method and apparatus capable of appropriately detecting a fault in the case of capturing an image of a panel a plurality of times using an infrared camera are provided.The wiring fault detection method according to the present invention acquires correspondence between individual test regions and pads corresponding to the individual test regions. The wiring fault detection apparatus according to the present invention includes pad switching means for switching a pad to which power is to be supplied to a pad corresponding to each test region.

    摘要翻译： 提供一种能够在使用红外线摄像机多次拍摄面板的情况下适当地检测故障的布线故障检测方法和装置。 根据本发明的布线故障检测方法获取各个测试区域和对应于各个测试区域的焊盘之间的对应关系。 根据本发明的接线故障检测装置包括焊盘切换装置，用于切换要向每个测试区域对应的焊盘供电的焊盘。

    DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
    8.
    发明申请
    DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD 审中-公开
    缺陷检查装置和缺陷检查方法

    公开(公告)号：US20140184784A1

    公开(公告)日：2014-07-03

    申请号：US14126016

    申请日：2012-05-18

    申请人： Masakazu Yanase

    发明人： Masakazu Yanase

    IPC分类号： G01N21/88 ,  H04N5/33

    CPC分类号： G01N21/8803 ,  G01N25/72 ,  G02F1/1309 ,  H04N5/33

    摘要： A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies a voltage to a terminal section of the wire; probe moving means for moving the probe to the terminal section; a first infrared sensor which photographs an entire surface of the panel; a second infrared sensor which photographs a part of the panel; and sensor moving means for moving the second infrared sensor to each position on the panel, the first infrared sensor including a plurality of infrared cameras.

    摘要翻译： 本发明的用于检测存在于形成在面板上的线中的缺陷的位置的本发明的缺陷检查装置包括：向所述导线的端子部分施加电压的探针; 用于将探头移动到终端部分的探针移动装置; 第一红外传感器，其照射面板的整个表面; 第二红外传感器，其照射面板的一部分; 以及用于将第二红外线传感器移动到面板上的每个位置的传感器移动装置，第一红外线传感器包括多个红外相机。