公开(公告)号：US09170194B2

公开(公告)日：2015-10-27

申请号：US14388298

申请日：2013-03-28

Applicant: YOKOGAWA ELECTRIC CORPORATION

Inventor： Yasushi Ichizawa ,  Kumiko Horikoshi ,  Kazuki Setsuda ,  Naomichi Chida

IPC: G01N21/3559 ,  G01N21/59 ,  G01N21/86 ,  G01J5/02 ,  G01N21/31

CPC classification number: G01N21/3559 ,  G01N21/59 ,  G01N21/86 ,  G01N2021/3148 ,  G01N2021/3174 ,  G01N2021/3181 ,  G01N2021/8663 ,  G01N2201/0627

Abstract: A material property measuring apparatus includes a radiation source irradiator configured to irradiate a measurement target material with radiation beams having n different wavelengths, a detector configured to detect intensities of radiation beams having the respective wavelengths after the irradiation of the measurement target material, and a processing unit configured to correct the detected intensity of the radiation beam having at least a part of the respective wavelengths using a correction coefficient in which rows and columns are respectively represented by a matrix of an order of n or less, and to calculate an index value indicating a property of the measurement target material on the basis of relative intensities of the radiation beams having the respective wavelengths after the correction.

Abstract translation: 材料性质测量装置包括：辐射源照射器，被配置为用测量目标材料照射具有n个不同波长的辐射束;检测器，被配置为检测在测量目标材料照射后具有各个波长的辐射束的强度;以及处理 单元，被配置为使用校正系数校正具有至少一部分各个波长的辐射束的检测强度，其中行和列分别由n或更小的阶数的矩阵表示，并且计算指示 基于校正后具有各波长的辐射束的相对强度，测量目标材料的特性。

公开(公告)号：US20230062325A1

公开(公告)日：2023-03-02

申请号：US17822661

申请日：2022-08-26

Applicant: YOKOGAWA ELECTRIC CORPORATION

Inventor： Kazufumi Nishida ,  Kumiko Horikoshi ,  Hitoshi Hara

IPC: G02B1/18 ,  G02B5/10 ,  G02B5/02

Abstract: An integrating sphere (10) of the present disclosure includes a hollow member (1) and a diffusive coating (4), on the inner surface of the hollow member (1), configured to scatter and reflect light from a light source within the hollow member (1) to yield diffused light. The diffusive coating (4) is coated with a hydrophobic coating (5). The accuracy of optical measurements using the integrating sphere (10) is improved by suppressed moisture absorption of the integrating sphere (10) and suppressed fluctuations in the efficiency of the integrating sphere (10).

公开(公告)号：US20150090885A1

公开(公告)日：2015-04-02

申请号：US14388298

申请日：2013-03-28

Applicant: YOKOGAWA ELECTRIC CORPORATION,

Inventor： Yasushi Ichizawa ,  Kumiko Horikoshi ,  Kazuki Setsuda ,  Naomichi Chida

IPC: G01N21/3559 ,  G01N21/86 ,  G01N21/59

CPC classification number: G01N21/3559 ,  G01N21/59 ,  G01N21/86 ,  G01N2021/3148 ,  G01N2021/3174 ,  G01N2021/3181 ,  G01N2021/8663 ,  G01N2201/0627

Abstract: A material property measuring apparatus includes a radiation source irradiator configured to irradiate a measurement target material with radiation beams having n different wavelengths, a detector configured to detect intensities of radiation beams having the respective wavelengths after the irradiation of the measurement target material, and a processing unit configured to correct the detected intensity of the radiation beam having at least a part of the respective wavelengths using a correction coefficient in which rows and columns are respectively represented by a matrix of an order of n or less, and to calculate an index value indicating a property of the measurement target material on the basis of relative intensities of the radiation beams having the respective wavelengths after the correction.

Abstract translation: 材料性质测量装置包括：辐射源照射器，被配置为用测量目标材料照射具有n个不同波长的辐射束;检测器，被配置为检测在测量目标材料照射后具有各个波长的辐射束的强度;以及处理 单元，被配置为使用校正系数校正具有至少一部分各个波长的辐射束的检测强度，其中行和列分别由n或更小的阶数的矩阵表示，并且计算指示 基于校正后具有各波长的辐射束的相对强度，测量目标材料的特性。