Apparatus and method for processing substrate using ion beam
    1.
    发明授权
    Apparatus and method for processing substrate using ion beam 有权
    使用离子束处理衬底的设备和方法

    公开(公告)号:US09312102B2

    公开(公告)日:2016-04-12

    申请号:US13315567

    申请日:2011-12-09

    IPC分类号: H01J37/302 H01J37/305

    摘要: A method of processing a substrate in an apparatus including a substrate holder which holds the substrate, an ion source which emits an ion beam, a neutralizer which emits electrons, and a shutter which is arranged between a space in which the ion source and the neutralizer are arranged and a space in which the substrate holder is arranged, and configured to shield the ion beam traveling toward the substrate, includes adjusting an amount of electrons which are emitted by the neutralizer and reach the substrate holder during movement of the shutter.

    摘要翻译: 一种在包括保持衬底的衬底保持器,发射离子束的离子源,发射电子的中和器和快门的设备中处理衬底的方法,该快门设置在离子源和中和器之间的空间中 布置有衬底保持器布置的空间,并且被构造成屏蔽朝向衬底行进的离子束,包括调节由中和器发射的电子的量并且在快门移动期间到达衬底保持器。

    APPARATUS AND METHOD FOR PROCESSING SUBSTRATE USING ION BEAM
    2.
    发明申请
    APPARATUS AND METHOD FOR PROCESSING SUBSTRATE USING ION BEAM 有权
    使用离子束处理基板的装置和方法

    公开(公告)号:US20120145535A1

    公开(公告)日:2012-06-14

    申请号:US13315567

    申请日:2011-12-09

    IPC分类号: H01L21/02 B44C1/22 C23C14/34

    摘要: A method of processing a substrate in an apparatus including a substrate holder which holds the substrate, an ion source which emits an ion beam, a neutralizer which emits electrons, and a shutter which is arranged between a space in which the ion source and the neutralizer are arranged and a space in which the substrate holder is arranged, and configured to shield the ion beam traveling toward the substrate, includes adjusting an amount of electrons which are emitted by the neutralizer and reach the substrate holder during movement of the shutter.

    摘要翻译: 一种在包括保持衬底的衬底保持器,发射离子束的离子源,发射电子的中和器和快门的设备中处理衬底的方法,该快门设置在离子源和中和器之间的空间中 布置有衬底保持器布置的空间,并且被构造成屏蔽朝向衬底行进的离子束,包括调节由中和器发射的电子的量并且在快门移动期间到达衬底保持器。