IC device inspection apparatus
    2.
    发明授权
    IC device inspection apparatus 失效
    IC装置检查装置

    公开(公告)号:US06377064B1

    公开(公告)日:2002-04-23

    申请号:US09607165

    申请日:2000-06-29

    IPC分类号: F25B2900

    摘要: An IC device to be inspected is received in a chamber, and an IC tester Judges performance of the IC device. An electrical connection device is arranged outside the chamber and has a conductive passage electrically connecting between the IC tester and the IC device. An IC socket is retained on the electrical connection device, for having the IC device inserted therein. A magnetometric sensor is arranged close to the conductive passage of the electrical connection device, for detecting a magnetic field generated when electric current is supplied to the IC device. A temperature control device controls a temperature of the IC device. A control unit controls the temperature control device based on a signal delivered from the magnetometric sensor, to maintain the temperature of the IC device within a predetermined temperature range.

    摘要翻译: 在室内接收待检查的IC器件,IC测试仪判断IC器件的性能。 电连接装置设置在室外,并且具有电连接IC测试器和IC器件之间的导电通路。 IC插座保持在电连接装置上,用于将IC器件插入其中。 磁电传感器布置在电连接装置的导电通道附近,用于检测当向IC器件提供电流时产生的磁场。 温度控制装置控制IC器件的温度。 控制单元基于从磁力计传感器传递的信号来控制温度控制装置,以将IC器件的温度保持在预定的温度范围内。