Greenhouse
    2.
    发明申请

    公开(公告)号:US20220132752A1

    公开(公告)日:2022-05-05

    申请号:US17137480

    申请日:2020-12-30

    申请人: Yi Feng

    发明人: Yi Feng

    摘要: A greenhouse comprises a support frame and a spray pipe including pipes and pipe joints, the pipe joint comprises a connecting pipe and two rotary sleeves, the two adjacent pipes are respectively inserted into the connecting pipe, ends of a first pipe are respectively sleeved with a sealing sleeve and a locking sleeve, and each of the ends of the first pipe is further sleeved with a washer. When the rotary sleeve is thread-tightened, the connecting pipe and the locking sleeve are capable of respectively abutting and pressing against two sides of the washer, under abutting and pushing of the rotary sleeve and limiting of the washer, the locking sleeve is capable of grasping the first pipe and forming an axial positioning with the rotary sleeve. An inner edge of an end surface of the connecting pipe has a sealing tapered surface capable of acting on the sealing sleeve.

    PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES
    3.
    发明申请
    PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES 审中-公开
    探头电压对比测试结构

    公开(公告)号:US20120319716A1

    公开(公告)日:2012-12-20

    申请号:US13593975

    申请日:2012-08-24

    IPC分类号: G01R1/067

    CPC分类号: G01R31/2884

    摘要: Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end portion of each floating tine, and connecting the floating tines to the second probe pad, and the third probe pad being a control pad which controls the switching devices. A probe-able VC serpentine test structure that includes first, second, third and fourth probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines and each floating tine connected together between the second and third probe pads, switching devices connected to an end portion of each floating tine and connecting the floating tines to the second and third probe pads, and the fourth probe pad being a control pad which controls the switching devices.

    摘要翻译: 使用其检测缺陷的测试结构和方法。 包括第一,第二和第三探针焊盘的可探测电压对比度(VC)梳状测试结构,包括接地尖齿的梳状结构,接地尖端之间的浮动尖齿,与每个浮动齿的端部耦合的开关装置, 以及将所述浮动尖齿连接到所述第二探针焊盘,并且所述第三探针焊盘是控制所述切换装置的控制焊盘。 一种可探测的VC蛇形测试结构,包括第一,第二,第三和第四探针焊盘,包括接地尖齿的梳状结构,接地尖齿之间的浮动尖齿和连接在第二和第三探针焊盘之间的每个浮动齿,切换 连接到每个浮动齿的端部并且将浮动尖齿连接到第二和第三探针焊盘的装置,第四探针焊盘是控制开关装置的控制焊盘。

    Turbulizers and Method of Forming Same
    4.
    发明申请
    Turbulizers and Method of Forming Same 审中-公开
    湍流器及其形成方法

    公开(公告)号:US20120144891A1

    公开(公告)日:2012-06-14

    申请号:US13399524

    申请日:2012-02-17

    IPC分类号: B21D53/04 B21D13/10

    摘要: Disclosed is a method of forming a heat exchanger turbulizer apparatus including a member having a longitudinal axis, a lateral width and a plurality of strips including first strips and second strips, each strip extending widthwise and being corrugated longitudinally so as to form a plurality of laterally spaced-apart sections connected to one another by bridges projecting from the sections in a common direction, the bridges of the first and second strips extending in the same direction and the corrugations of the second strips being offset laterally from the corrugations of the first strips. The method comprises: crimping longitudinally-corrugated strip material between first and second forming dies to form said apparatus, said dies being adapted such that substantially all lateral movement of strip material in crimping results from strip material being drawn laterally by material that has been displaced in a direction parallel to the direction of die movement.

    摘要翻译: 公开了一种形成热交换器湍流器装置的方法,该装置包括具有纵向轴线,横向宽度以及包括第一条带和第二条带的多个条带的部件,每条条宽度方向延伸并纵向波纹形成多个横向 间隔开的部分通过沿共同方向从部分突出的桥彼此连接,第一和第二条带的桥沿相同方向延伸,并且第二条带的波纹从第一条带的波纹侧向偏移。 该方法包括:将第一和第二成形模之间的纵向波纹状条材料卷曲以形成所述装置,所述模具适于使得条带材料在卷曲中的基本上所有横向运动都是由条带材料横向地被已经被移位的材料横向牵引 平行于模具移动方向的方向。

    Probe-able voltage contrast test structures

    公开(公告)号:US09213060B2

    公开(公告)日:2015-12-15

    申请号:US13593961

    申请日:2012-08-24

    IPC分类号: G01R31/20 G01R31/28

    CPC分类号: G01R31/2884

    摘要: Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end portion of each floating tine, and connecting the floating tines to the second probe pad, and the third probe pad being a control pad which controls the switching devices. A probe-able VC serpentine test structure that includes first, second, third and fourth probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines and each floating tine connected together between the second and third probe pads, switching devices connected to an end portion of each floating tine and connecting the floating tines to the second and third probe pads, and the fourth probe pad being a control pad which controls the switching devices.

    Probe-able voltage contrast test structures
    6.
    发明授权
    Probe-able voltage contrast test structures 有权
    可测电压对比测试结构

    公开(公告)号:US09097760B2

    公开(公告)日:2015-08-04

    申请号:US13593983

    申请日:2012-08-24

    IPC分类号: G01R31/20 G01R31/28

    CPC分类号: G01R31/2884

    摘要: Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end portion of each floating tine, and connecting the floating tines to the second probe pad, and the third probe pad being a control pad which controls the switching devices. A probe-able VC serpentine test structure that includes first, second, third and fourth probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines and each floating tine connected together between the second and third probe pads, switching devices connected to an end portion of each floating tine and connecting the floating tines to the second and third probe pads, and the fourth probe pad being a control pad which controls the switching devices.

    摘要翻译: 使用其检测缺陷的测试结构和方法。 包括第一,第二和第三探针焊盘的可探测电压对比度(VC)梳状测试结构,包括接地尖齿的梳状结构,接地尖端之间的浮动尖齿,与每个浮动齿的端部耦合的开关装置, 以及将所述浮动尖齿连接到所述第二探针焊盘,并且所述第三探针焊盘是控制所述切换装置的控制焊盘。 一种可探测的VC蛇形测试结构,包括第一,第二,第三和第四探针焊盘,包括接地尖齿的梳状结构,接地尖齿之间的浮动尖齿和连接在第二和第三探针焊盘之间的每个浮动齿,切换 连接到每个浮动齿的端部并且将浮动尖齿连接到第二和第三探针焊盘的装置,第四探针焊盘是控制开关装置的控制焊盘。

    CHARGE ROLLER
    7.
    发明申请
    CHARGE ROLLER 审中-公开
    充电辊

    公开(公告)号:US20150018182A1

    公开(公告)日:2015-01-15

    申请号:US14375767

    申请日:2012-03-01

    IPC分类号: B05C1/08 H01B1/24 G03G15/02

    摘要: The present disclosure discloses a charge roller (1) particularly but not exclusively for charging a photoconductor in a liquid electro-photograph (LEP) image-forming apparatus. The charge roller includes a cured composition of an epichlorohydrin/ethylene oxide/allyl glycidyl ether terpolymer, a lithium salt and carbon black.

    摘要翻译: 本公开公开了一种充电辊(1),特别但不排他地用于在液体电照相(LEP)图像形成装置中充电感光体。 充电辊包括表氯醇/环氧乙烷/烯丙基缩水甘油醚三元共聚物,锂盐和炭黑的固化组合物。

    On-Chip Bus Arbitration Method and Device Thereof
    8.
    发明申请
    On-Chip Bus Arbitration Method and Device Thereof 审中-公开
    片上总线仲裁方法及其设备

    公开(公告)号:US20140189181A1

    公开(公告)日:2014-07-03

    申请号:US14124792

    申请日:2011-10-14

    IPC分类号: G06F13/362

    CPC分类号: G06F13/3625 G06F13/374

    摘要: A method and device for on-chip bus arbitration are disclosed. The method includes: dividing devices into a first level, a second level and a third level from high to low; and in each arbitration period, calculating remaining processing time of each real-time transaction, and upgrading a device making a request required to be processed immediately to the first level in the current arbitration period; monitoring bandwidth usage amount of devices of the first level and the second level respectively, and downgrading a device whose bandwidth usage amount exceeds a preset bandwidth threshold value to the third level in the current arbitration period; and in devices making requests for a bus use right, if a device of the highest level is the device of the first level, authorizing the device of the first level; and if it is not the device of the first level, authorizing a device making continuous requests.

    摘要翻译: 公开了用于片上总线仲裁的方法和装置。 该方法包括:将设备分为第一级,第二级和第三级,从高到低; 在每个仲裁期间,计算每个实时交易的剩余处理时间,并且在当前仲裁期间将要求立即处理的请求的设备升级到第一级; 分别监测第一级和第二级的设备的带宽使用量,并且在当前仲裁期间将其带宽使用量超过预设带宽阈值的设备降级到第三级; 并且在要求总线使用权的设备中,如果最高级别的设备是第一级的设备,授权第一级的设备; 并且如果不是第一级的设备,则授权连续请求的设备。

    Probe-able voltage contrast test structures

    公开(公告)号:US08350583B2

    公开(公告)日:2013-01-08

    申请号:US12539732

    申请日:2009-08-12

    IPC分类号: G01R31/20 G01R1/067

    CPC分类号: G01R31/2884

    摘要: Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end portion of each floating tine, and connecting the floating tines to the second probe pad, and the third probe pad being a control pad which controls the switching devices. A probe-able VC serpentine test structure that includes first, second, third and fourth probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines and each floating tine connected together between the second and third probe pads, switching devices connected to an end portion of each floating tine and connecting the floating tines to the second and third probe pads, and the fourth probe pad being a control pad which controls the switching devices.

    PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES
    10.
    发明申请

    公开(公告)号:US20120319714A1

    公开(公告)日:2012-12-20

    申请号:US13593983

    申请日:2012-08-24

    IPC分类号: G01R31/02 G01R1/067

    CPC分类号: G01R31/2884

    摘要: Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end portion of each floating tine, and connecting the floating tines to the second probe pad, and the third probe pad being a control pad which controls the switching devices. A probe-able VC serpentine test structure that includes first, second, third and fourth probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines and each floating tine connected together between the second and third probe pads, switching devices connected to an end portion of each floating tine and connecting the floating tines to the second and third probe pads, and the fourth probe pad being a control pad which controls the switching devices.