摘要:
A current-type driver of light emitting devices is provided. The current-type driver includes a power conversion circuit, a feedback module, and a control module. The power conversion circuit modulates and generates an output voltage according to a feedback signal so as to sequentially drive a plurality of light emitting devices. The feedback module generates the feedback signal for the power conversion circuit according to the output voltage and an adjusting signal during a first period, wherein none of the light emitting devices is driven during the first period. The control module outputs the adjusting signal to the feedback module during the first period so as to allow the power conversion circuit to adjust the output voltage to a pre-drive voltage corresponding to the light emitting device which is to be driven next among the light emitting devices.
摘要:
A current-type driver of light emitting devices is provided. The current-type driver includes a power conversion circuit, a feedback module, and a control module. The power conversion circuit modulates and generates an output voltage according to a feedback signal so as to sequentially drive a plurality of light emitting devices. The feedback module generates the feedback signal for the power conversion circuit according to the output voltage and an adjusting signal during a first period, wherein none of the light emitting devices is driven during the first period. The control module outputs the adjusting signal to the feedback module during the first period so as to allow the power conversion circuit to adjust the output voltage to a pre-drive voltage corresponding to the light emitting device which is to be driven next among the light emitting devices.
摘要:
A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time and a high test cost, and the condition of a connection failure is hard to be analyzed after a test failure. In the present invention, a voltage variation caused when an ESD element in a chip is conducted and a comparison circuits are used to determine whether a connection is correct. Furthermore, the test apparatus is built in the chip, so that the connection test may be accomplished quickly and efficiently. Once a connection failure occurs, the failed connection pin can also be found, so as to be favorable for engineering analysis and thereby effectively saving the test cost.
摘要:
A pixel circuitry of a display device and a display method thereof are provided herein. The pixel circuitry includes a scan switch, a storage element, and a sampling circuitry. The scan switch has a first terminal coupled to a data line and configured to be asserted according to a scan signal. The storage element is coupled to a second terminal of the scan switch and configured to store a pixel voltage from the data line. The sampling circuitry is configured to sample the stored pixel voltage of the storage element and to obtain a reference voltage for the display device according to the sampled signal. By sampling the stored pixel voltage of the storage element, whether the pixel voltages with different polarities are symmetry can be detected for avoiding flickers.
摘要:
The LCoS panel includes a display region, an odd and an even data drivers, and a data-line testing unit. The display region includes a plurality of pixel cells formed at each intersection of a plurality of scan lines and a plurality of data lines. The data lines include a plurality of odd data lines coupled to a plurality of first data channels of the odd data driver, and the data lines include a plurality of even data lines coupled to a plurality of second data channels of the even data driver. The odd and the even data drivers are arranged in a first side of the display region. The data-line testing unit is arranged in a second side of the display region opposite to the first side for selectively outputting a data-line testing signal corresponding to one of the data lines according to a data-line selecting signal.
摘要:
A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time and a high test cost, and the condition of a connection failure is hard to be analyzed after a test failure. In the present invention, a voltage variation caused when an ESD element in a chip is conducted and a comparison circuits are used to determine whether a connection is correct. Furthermore, the test apparatus is built in the chip, so that the connection test may be accomplished quickly and efficiently. Once a connection failure occurs, the failed connection pin can also be found, so as to be favorable for engineering analysis and thereby effectively saving the test cost.
摘要:
A pixel circuitry of a display device and a display method thereof are provided herein. The pixel circuitry includes a scan switch, a storage element, and a sampling circuitry. The scan switch has a first terminal coupled to a data line and configured to be asserted according to a scan signal. The storage element is coupled to a second terminal of the scan switch and configured to store a pixel voltage from the data line. The sampling circuitry is configured to sample the stored pixel voltage of the storage element and to obtain a reference voltage for the display device according to the sampled signal. By sampling the stored pixel voltage of the storage element, whether the pixel voltages with different polarities are symmetry can be detected for avoiding flickers.
摘要:
The present invention relates to a LCOS display driving system. The driving sequential control block generates a control code representing a loading sequence of the R, G, and B data for pixels in one of scan lines. The multiplexer multiplexes the R, G, and B data from latches according the control code. The shared level shifter shifts the level of the R, G, and B data from the multiplexer. The digital analog converts converting the R, G, and B data to a corresponding analog R, G, and B data voltage. The shared unity-gain buffer stores the analog R, G, and B data voltage from the shared digital analog converter. The demultiplexer demultiplexes the analog R, G, and B data voltage according the control code.
摘要:
An LCOS IC and electronic device using the same is provided. The electronic device comprises an LCOS IC, a processor and a cooler. The LCOS IC comprising a temperature sensor embedded in the LCOS IC for sensing a temperature and outputting a temperature sensing signal according to the temperature. The processor is coupled to the LCOS IC for receiving the temperature sensing signal and outputting a cooler control signal according to the temperature sensing signal. The cooler is coupled to the processor for receiving the cooler control signal and adjusting the cooler accordingly.
摘要:
A method for driving a dark ring of a liquid-crystal-on-silicon (LCOS) display is provided to prevent the fringe effect (bright lines) due to the constant voltage difference between the dark ring and the adjoining pixels within the LCOS display. A dark ring is divided into a plurality of portions. The polarity of each portion is controlled in accordance with the polarity of the adjoining pixels within the LCOS display and the scan direction of gate drivers such that the polarity inversion for each portion will coincide with that for the adjoining pixels within the LCOS display so as to avoid the fringe effect (bright lines).