公开(公告)号：US20090040601A1

公开(公告)日：2009-02-12

申请号：US11913941

申请日：2006-05-17

申请人： Yoshiharu Saito ,  Hirofumi Takatsuka ,  Eiji Nakasho

发明人： Yoshiharu Saito ,  Hirofumi Takatsuka ,  Eiji Nakasho

IPC分类号： G02B21/06

CPC分类号： G02B21/14 ,  G02B21/0092

摘要： It in an object to acquire a high-precision polarization image. Provided is a polarization microscope comprising an illumination optical system 3 including a light source, a polarizer for converting a polarization state of illumination light from the light source, and a condenser lens for condensing the illumination light transmitted through the polarizer onto a specimen; an image-acquisition optical system including an objective lens for collecting observation light from the specimen, an analyzer for converting a polarization state of the observation light collected by the objective lens, and an image-acquisition device for acquiring the observation light transmitted through the analyzer; an observation-light angle correcting element for correcting changes in rotation angle of a polarization plane of the observation light in the image-acquisition optical system; and an observation-light phase-difference correcting element for correcting changes in phase difference between P-polarization and S-polarization of the observation light in the image-acquisition optical system, wherein amounts of correction of these correcting elements vary in directions intersecting an optical axis.

摘要翻译： 其目的在于获得高精度偏振图像。 本发明提供一种偏振显微镜，包括：照明光学系统3，包括光源;偏振器，用于转换来自光源的照明光的偏振状态;以及聚光透镜，用于将透过偏振器的照明光聚焦到样本上; 包括用于收集来自样本的观察光的物镜的图像采集光学系统，用于转换由物镜收集的观察光的偏振状态的分析器和用于获取透射通过分析器的观察光的图像获取装置 ; 观察光角度校正元件，用于校正图像采集光学系统中的观察光的偏振面的旋转角度的变化; 以及观察光相位差校正元件，用于校正图像采集光学系统中的观察光的P偏振和S偏振之间的相位差的变化，其中这些校正元件的校正量在与光学相交的方向上变化 轴。

公开(公告)号：US09007453B2

公开(公告)日：2015-04-14

申请号：US13603696

申请日：2012-09-05

申请人： Eiji Nakasho

发明人： Eiji Nakasho

IPC分类号： H04N7/18 ,  G02B7/36 ,  G02B21/00 ,  G02B21/36 ,  H04N9/82

CPC分类号： G02B7/365 ,  G02B21/0076 ,  G02B21/0084 ,  G02B21/367 ,  H04N9/8205

摘要： Time lapse observation method includes: before a process to obtain a first time lapse image, capturing an image of a reference area on a sample being a partial area of a target area or an area in a vicinity of the target area being a smaller area than the target area to obtain a reference image; storing a position of a capturing area in capturing the reference image as a reference position; before a process to obtain the time lapse image performed, setting a position of the capturing area sequentially at different positions in the optical axis direction of an objective including the reference position and capturing an image at each of the positions to obtain comparison target images; and matching the capturing area with the target area, based on a comparison result of the reference image and the comparison target images.

摘要翻译： 时间延迟观察方法包括：在获得第一时间流逝图像的处理之前，在作为目标区域的部分区域或目标区域附近的区域的样本上捕获参考区域的图像是比 目标区域获得参考图像; 存储拍摄区域的位置以捕获参考图像作为参考位置; 在获取所执行的时间流逝图像的处理之前，将拍摄区域的位置顺序地设置在包括基准位置的物体的光轴方向上的不同位置处，并且在每个位置处拍摄图像以获得比较目标图像; 并且基于参考图像和比较对象图像的比较结果，将拍摄区域与目标区域进行匹配。

公开(公告)号：US08619252B2

公开(公告)日：2013-12-31

申请号：US13298521

申请日：2011-11-17

申请人： Eiji Nakasho

发明人： Eiji Nakasho

IPC分类号： G01J1/42

CPC分类号： G01J1/42 ,  G01J1/0462 ,  G01J1/32 ,  G02B21/0096

摘要： A light intensity measuring unit for measuring an intensity of light emitted from a microscope includes an aperture stop, a field stop, at least one measurement lens arranged between the aperture stop and the field stop, and an interface for attachment to a microscope. The aperture stop is positioned on or close to a back focal plane of the at least one measurement lens. The field stop is positioned on or close to a front focal plane of the at least one measurement lens.

摘要翻译： 用于测量从显微镜发射的光的强度的光强度测量单元包括孔径光阑，场光阑，布置在孔径光阑和场光阑之间的至少一个测量透镜，以及用于附着到显微镜的界面。 孔径光阑位于或接近至少一个测量透镜的后焦平面。 所述场停止件位于所述至少一个测量透镜的前焦平面上或靠近所述至少一个测量透镜的前焦平面。