METHOD FOR FERMENTING ANTLERS, VENISON, OR DEER BONES USING MUSHROOMS, AND RESULTANT FERMENTED PRODUCTS
    1.
    发明申请
    METHOD FOR FERMENTING ANTLERS, VENISON, OR DEER BONES USING MUSHROOMS, AND RESULTANT FERMENTED PRODUCTS 审中-公开
    使用FOR FOR FOR TING AN AN AN PRODUCTS PRODUCTS PRODUCTS PRODUCTS PRODUCTS PRODUCTS PRODUCTS PRODUCTS PRODUCTS PRODUCTS PRODUCTS PRODUCTS PRODUCTS PRODUCTS PRODUCTS

    公开(公告)号:US20140017333A1

    公开(公告)日:2014-01-16

    申请号:US14003539

    申请日:2012-02-24

    IPC分类号: A61K35/32 C12P1/02

    摘要: The present invention relates to a method of fermenting velvet antler (or venison or deer bone) together with a mushroom concentration in order to increase the efficacy thereof, and a fermentation product obtained thereby. In accordance with the present invention, velvet antler is fermented in a state in which it was not concentrated or ground, and the shape thereof is maintained after fermentation. Thus, the loss of velvet antler is insignificant, and the fermented velvet antler has a high efficacy and can be used in various shapes in subsequent processes.

    摘要翻译: 本发明涉及一种将天鹅绒鹿茸(或鹿肉或鹿骨)与蘑菇浓度一起发酵以提高其功效的方法,以及由此获得的发酵产物。 根据本发明,天鹅绒鹿茸在未浓缩或研磨的状态下发酵,发酵后保持其形状。 因此,天鹅绒鹿茸的损失是微不足道的,发酵天鹅绒鹿茸具有高效率,并且可以在后续过程中以各种形状使用。

    Transmission electron microscope specimen and method of manufacturing the same
    2.
    发明授权
    Transmission electron microscope specimen and method of manufacturing the same 失效
    透射电子显微镜样品及其制造方法

    公开(公告)号:US07297950B2

    公开(公告)日:2007-11-20

    申请号:US11241953

    申请日:2005-10-04

    IPC分类号: G01N23/00 G21K7/00

    CPC分类号: G01N1/32 G01N1/286

    摘要: A transmission electron microscope (TEM) specimen and a method of manufacturing the specimen are provided. The specimen comprises an analysis point. The specimen is formed by forming a dimple at a surface portion of the preliminary specimen, and ion milling the preliminary specimen having the dimple.

    摘要翻译: 提供透射电子显微镜(TEM)试样和制造试样的方法。 样本包括分析点。 试样通过在预备试样的表面部分形成凹坑,离子研磨具有凹坑的预备样品而形成。

    Transmission electron microscope specimen and method of manufacturing the same
    3.
    发明申请
    Transmission electron microscope specimen and method of manufacturing the same 失效
    透射电子显微镜样品及其制造方法

    公开(公告)号:US20060097168A1

    公开(公告)日:2006-05-11

    申请号:US11241953

    申请日:2005-10-04

    IPC分类号: G21K7/00

    CPC分类号: G01N1/32 G01N1/286

    摘要: A transmission electron microscope (TEM) specimen and a method of manufacturing the specimen are provided. The specimen comprises an analysis point. The specimen is formed by forming a dimple at a surface portion of the preliminary specimen, and ion milling the preliminary specimen having the dimple.

    摘要翻译: 提供透射电子显微镜(TEM)试样和制造试样的方法。 样本包括分析点。 试样通过在预备试样的表面部分形成凹坑,离子研磨具有凹坑的预备样品而形成。