SEMICONDUCTOR DEVICES INCLUDING CAPACITORS
    2.
    发明申请
    SEMICONDUCTOR DEVICES INCLUDING CAPACITORS 有权
    包括电容器的半导体器件

    公开(公告)号:US20140361403A1

    公开(公告)日:2014-12-11

    申请号:US14296850

    申请日:2014-06-05

    IPC分类号: H01L49/02

    摘要: A semiconductor device includes a first capacitor structure, a second capacitor structure, and an insulation pattern. The first capacitor structure includes a first lower electrode, a first dielectric layer and a first upper electrode sequentially stacked on a substrate. The second capacitor structure includes a second lower electrode, a second dielectric layer and a second upper electrode sequentially stacked on the substrate, and is adjacent to the first capacitor structure. The insulation pattern partially fills a space between the first and second capacitor structures, and an air gap is formed between the first and second capacitor structures on the insulation pattern.

    摘要翻译: 半导体器件包括第一电容器结构,第二电容器结构和绝缘图案。 第一电容器结构包括顺序堆叠在基板上的第一下电极,第一电介质层和第一上电极。 第二电容器结构包括第二下电极,第二电介质层和顺序堆叠在基板上并与第一电容器结构相邻的第二上电极。 绝缘图案部分地填充第一和第二电容器结构之间的空间,并且在绝缘图案上的第一和第二电容器结构之间形成气隙。

    Method and apparatus for analyzing the composition of an object
    3.
    发明授权
    Method and apparatus for analyzing the composition of an object 有权
    用于分析物体的组成的方法和装置

    公开(公告)号:US07105813B2

    公开(公告)日:2006-09-12

    申请号:US10924852

    申请日:2004-08-25

    申请人: Jun-Soo Lee

    发明人: Jun-Soo Lee

    IPC分类号: H01J37/20

    摘要: An ion analyzing apparatus for analyzing the composition of an object includes a chamber maintained under a vacuum, a support for supporting a plurality of objects disposed in the chamber, and a drive unit that selects one of the supported objects and rotates the selected object. An ion generator irradiates the rotating object with primary ions. A detector detects secondary ions emitted from the rotating object. An analyzer analyzes the secondary ions. A transfer device is connected to the supporter. The transfer device rotates the support or moves the support linearly in a horizontal direction to place an object at a predetermined position at which the object is selected and rotated by the drive unit.

    摘要翻译: 用于分析物体的组成的离子分析装置包括保持在真空下的室,用于支撑设置在室中的多个物体的支撑件,以及驱动单元,其选择被支撑物体中的一个并旋转所选择的物体。 离子发生器用一次离子照射旋转物体。 检测器检测从旋转物体发射的二次离子。 分析仪分析二次离子。 传送设备连接到支持者。 传送装置使支撑件旋转或者使水平方向线性移动支架,以将物体放置在由驱动单元选择和旋转物体的预定位置。

    Method and apparatus for analyzing the composition of an object
    4.
    发明申请
    Method and apparatus for analyzing the composition of an object 有权
    用于分析物体的组成的方法和装置

    公开(公告)号:US20050056777A1

    公开(公告)日:2005-03-17

    申请号:US10924852

    申请日:2004-08-25

    申请人: Jun-Soo Lee

    发明人: Jun-Soo Lee

    摘要: An ion analyzing apparatus for analyzing the composition of an object includes a chamber maintained under a vacuum, a support for supporting a plurality of objects disposed in the chamber, and a drive unit that selects one of the supported objects and rotates the selected object. An ion generator irradiates the rotating object with primary ions. A detector detects secondary ions emitted from the rotating object. An analyzer analyzes the secondary ions. A transfer device is connected to the supporter. The transfer device rotates the support or moves the support linearly in a horizontal direction to place an object at a predetermined position at which the object is selected and rotated by the drive unit.

    摘要翻译: 用于分析物体的组成的离子分析装置包括保持在真空下的室,用于支撑设置在室中的多个物体的支撑件,以及驱动单元,其选择被支撑物体中的一个并旋转所选择的物体。 离子发生器用一次离子照射旋转物体。 检测器检测从旋转物体发射的二次离子。 分析仪分析二次离子。 传送设备连接到支持者。 传送装置使支撑件旋转或者使水平方向线性地移动支撑件,以将物体放置在由驱动单元选择和旋转物体的预定位置处。