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公开(公告)号:US20090309230A1
公开(公告)日:2009-12-17
申请号:US12336884
申请日:2008-12-17
IPC分类号: H01L21/768 , H01L23/535
CPC分类号: H01L23/5222 , H01L21/02115 , H01L21/02271 , H01L21/0337 , H01L21/31144 , H01L21/3146 , H01L21/7682 , H01L21/76831 , H01L21/76832 , H01L23/53238 , H01L2924/0002 , H01L2924/00
摘要: Methods for patterning films and their resulting structures. In an embodiment, an amorphous carbon mask is formed over a substrate, such as a damascene layer. A spacer layer is deposited over the amorphous carbon mask and the spacer layer is etched to form a spacer and to expose the amorphous carbon mask. The amorphous carbon mask is removed selectively to the spacer to expose the substrate layer. A gap fill layer is deposited around the spacer to cover the substrate layer but expose the spacer. The spacer is removed selectively to form a gap fill mask over the substrate. The pattern of the gap fill mask is transferred, in one implementation, into a damascene layer to remove at least a portion of an IMD and form an air gap.
摘要翻译: 膜图案及其结果的方法。 在一个实施方案中,在诸如镶嵌层的基底上形成无定形碳掩模。 在无定形碳掩模上沉积间隔层,并且蚀刻间隔层以形成间隔物并暴露无定形碳掩模。 无定形碳掩模被选择性地去除到间隔物以暴露衬底层。 间隔填充层沉积在间隔物周围以覆盖基底层,但暴露间隔物。 选择性地移除间隔物以在衬底上形成间隙填充掩模。 间隙填充掩模的图案在一个实施方式中转移到镶嵌层中以去除IMD的至少一部分并形成气隙。