AIR GAP FORMATION AND INTEGRATION USING A PATTERNING CAP
    1.
    发明申请
    AIR GAP FORMATION AND INTEGRATION USING A PATTERNING CAP 有权
    空气隙形成和整合使用图案盖

    公开(公告)号:US20090309230A1

    公开(公告)日:2009-12-17

    申请号:US12336884

    申请日:2008-12-17

    IPC分类号: H01L21/768 H01L23/535

    摘要: Methods for patterning films and their resulting structures. In an embodiment, an amorphous carbon mask is formed over a substrate, such as a damascene layer. A spacer layer is deposited over the amorphous carbon mask and the spacer layer is etched to form a spacer and to expose the amorphous carbon mask. The amorphous carbon mask is removed selectively to the spacer to expose the substrate layer. A gap fill layer is deposited around the spacer to cover the substrate layer but expose the spacer. The spacer is removed selectively to form a gap fill mask over the substrate. The pattern of the gap fill mask is transferred, in one implementation, into a damascene layer to remove at least a portion of an IMD and form an air gap.

    摘要翻译: 膜图案及其结果的方法。 在一个实施方案中,在诸如镶嵌层的基底上形成无定形碳掩模。 在无定形碳掩模上沉积间隔层,并且蚀刻间隔层以形成间隔物并暴露无定形碳掩模。 无定形碳掩模被选择性地去除到间隔物以暴露衬底层。 间隔填充层沉积在间隔物周围以覆盖基底层,但暴露间隔物。 选择性地移除间隔物以在衬底上形成间隙填充掩模。 间隙填充掩模的图案在一个实施方式中转移到镶嵌层中以去除IMD的至少一部分并形成气隙。