Method to test the quality factor of a MEMS gyroscope at chip probe

    公开(公告)号:US10267636B1

    公开(公告)日:2019-04-23

    申请号:US14987685

    申请日:2016-01-04

    申请人: mCube, Inc.

    IPC分类号: G01C19/5684 B81C99/00

    摘要: A method for a MEMS device comprises determining in a computer system, a first driving signal for the MEMS device in response to a first time delay and to a base driving signal, applying the first driving signal to the MEMS device to induce the MEMS device to operate at a first frequency, determining a second driving signal for the MEMS device in response to a second time delay and to the base driving signal, applying the second driving signal to the MEMS device to induce the MEMS device to operate at a second frequency, determining a first quality factor associated with the MEMS device in response to the first frequency and the second frequency, determining a quality factor associated with the MEMS device in response to the first quality factor, and determining whether the quality factor associated with the MEMS device, exceeds a threshold quality factor.