公开(公告)号：US6140643A

公开(公告)日：2000-10-31

申请号：US265446

申请日：1999-03-09

申请人： Roy W. Brown ,  Chul-Sung Kim

发明人： Roy W. Brown ,  Chul-Sung Kim

IPC分类号： G01N23/06 ,  G01Q30/04 ,  G21N23/225

CPC分类号： G01N23/063

摘要： The present invention relates to a method for determining the mineral composition of an unknown material using both a fuzzy classification system and a confidence measure of substances identified by the fuzzy classification system. The method can be adapted for identification of pore space and sample points containing more than one material.

摘要翻译： 本发明涉及使用模糊分类系统和由模糊分类系统识别的物质的置信度测量来确定未知材料的矿物组成的方法。 该方法可适用于孔隙空间的识别和含有多种材料的样品点。

公开(公告)号：US5708692A

公开(公告)日：1998-01-13

申请号：US758806

申请日：1996-12-03

申请人： Dennis Connolly ,  Walter R. Mohn ,  Bart A. Stuchell

发明人： Dennis Connolly ,  Walter R. Mohn ,  Bart A. Stuchell

IPC分类号： G01N23/06 ,  G01N23/223

CPC分类号： G01N23/063

摘要： A method and apparatus for measuring a target analyte diffused in a wall of a metal member provides a sample of the metal member which is cut to progressively reduce a wall thickness of the sample from zero at a first point on the sample to a selected depth at a second point on the sample. An x-ray analyzing system having an analyzing slot is moved past the sample between the first and second points. Data from the x-ray analyzing system during the translation of the sample is collected to analyze the analyte content.

摘要翻译： 用于测量在金属构件的壁中扩散的目标分析物的方法和设备提供金属构件的样品，其被切割以逐渐将样品的壁厚从样品上的第一点处的零减小到所选样品的选定深度 样品上的第二个点。 具有分析槽的x射线分析系统在第一和第二点之间移动经过样本。 收集样品翻译过程中X射线分析系统的数据，分析分析物含量。

公开(公告)号：US09404875B2

公开(公告)日：2016-08-02

申请号：US14228340

申请日：2014-03-28

申请人： Rapiscan Systems, Inc.

发明人： Willem G. J. Langeveld

IPC分类号： G01N23/06 ,  G01N23/087

CPC分类号： G01N23/063 ,  G01N23/085 ,  G01N23/087

摘要： The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.

摘要翻译： 该申请公开了用于通过生成预定数量的传输数据样本来确定被扫描的材料的原子序号，确定传输数据样本的方差以及通过比较方差来确定被扫描的材料的原子序号的系统和方法， 将传输数据样本的方差的导数代入一个或多个预定方差。 本申请还公开了通过导出正被扫描的材料的传输信号样本来确定被扫描的材料的原子序号，确定信号样本的方差，以及通过比较方差来确定被扫描的材料的原子序数来确定被扫描材料的​​原子序号的系统和方法 信号样本或方差的导数代表一个或多个预定方差。

公开(公告)号：US08891730B2

公开(公告)日：2014-11-18

申请号：US13738680

申请日：2013-01-10

申请人： Phoenix Conveyor Belt Systems GmbH

发明人： Bernd Kuesel

IPC分类号： G01N23/02 ,  B65G43/02 ,  G01N23/06 ,  B65G15/36 ,  G01N23/16

CPC分类号： G01N23/063 ,  B65G15/36 ,  B65G43/02 ,  G01N23/085 ,  G01N23/16

摘要： The invention is directed to an apparatus for continuous and non-destructive monitoring of the connection of a conveyor belt. During movement of the conveyor belt, a radiation source emits rays in the direction of the belt surface. The rays are of such high energy that they penetrate the conveyor belt and the connection thereof within a material-free region. A sensor detects the rays which have passed through. A process computer evaluates the result of the radiographic examination by comparing the actual connection values to set connection values and connection limit values. The radiation source and the sensor are accommodated in a housing. The housing has two openings between the radiation source and the sensor through which the moving conveyor belt passes without contact. The housing is integrated into the lower run of a conveyor system.

摘要翻译： 本发明涉及一种连续和非破坏性地监测传送带连接的装置。 在输送带运动期间，辐射源沿着带表面的方向发射光线。 光线具有如此高的能量，使得它们在无材料区域内穿透传送带及其连接。 传感器检测已通过的光线。 过程计算机通过比较实际连接值来设置连续值和连接极限值来评估射线检查的结果。 辐射源和传感器容纳在壳体中。 壳体在辐射源和传感器之间具有两个开口，移动的传送带通过该开口通过而不接触。 外壳集成到输送机系统的下游。

公开(公告)号：US20130129042A1

公开(公告)日：2013-05-23

申请号：US13738680

申请日：2013-01-10

申请人： Phoenix Conveyor Belt Systems GmbH

发明人： Bernd Kuesel

IPC分类号： G01N23/06

CPC分类号： G01N23/063 ,  B65G15/36 ,  B65G43/02 ,  G01N23/085 ,  G01N23/16

摘要： The invention is directed to an apparatus for continuous and non-destructive monitoring of the connection of a conveyor belt. During movement of the conveyor belt, a radiation source emits rays in the direction of the belt surface. The rays are of such high energy that they penetrate the conveyor belt and the connection thereof within a material-free region. A sensor detects the rays which have passed through. A process computer evaluates the result of the radiographic examination by comparing the actual connection values to set connection values and connection limit values. The radiation source and the sensor are accommodated in a housing. The housing has two openings between the radiation source and the sensor through which the moving conveyor belt passes without contact. The housing is integrated into the lower run of a conveyor system.

摘要翻译： 本发明涉及一种连续和非破坏性地监测传送带连接的装置。 在输送带运动期间，辐射源沿着带表面的方向发射光线。 光线具有如此高的能量，使得它们在无材料区域内穿透传送带及其连接。 传感器检测已通过的光线。 过程计算机通过比较实际连接值来设置连续值和连接极限值来评估射线检查的结果。 辐射源和传感器容纳在壳体中。 壳体在辐射源和传感器之间具有两个开口，移动的传送带通过该开口通过而不接触。 外壳集成到输送机系统的下游。

公开(公告)号：US4642811A

公开(公告)日：1987-02-10

申请号：US619841

申请日：1984-06-12

申请人： Panayotis Georgopoulos

发明人： Panayotis Georgopoulos

IPC分类号： G01N23/06 ,  G01N23/08

CPC分类号： G01N23/063

摘要： An apparatus for performing extend X-ray absorption fine structure (EXAFS) measurements on materials. The EXAFS apparatus is constructed using a conventional X-ray powder diffractometer assembly with a rotating anode X-ray source affixed to the diffractometer assembly, a monochromator crystal rotatably positioned at the center of the assembly and a specimen stage and detectors slidingly mounted on a receiving track of the assembly. The monochromator crystal is automatically and elastically distorted to provide a monochromatic X-ray beam flux from the crystal. The angle of incidence of the source X-ray beam with the crystal surface is changed to provide a different monochromatic X-ray wavelength with changing energy, which enables measurement of the desired EXAFS spectra for the material.

摘要翻译： 用于对材料进行扩展X射线吸收精细结构（EXAFS）测量的装置。 EXAFS设备是使用常规的X射线粉末衍射仪组件构建的，其中旋转阳极X射线源固定到衍射仪组件，可旋转地定位在组件中心的单色器晶体和滑动地安装在接收器上的检测台和检测器 轨道的装配。 单色器晶体自动弹性变形，从晶体提供单色X射线光束。 源X射线束与晶体表面的入射角改变，以提供具有变化能量的不同单色X射线波长，这使得能够测量材料的期望的EXAFS光谱。

公开(公告)号：US20110096906A1

公开(公告)日：2011-04-28

申请号：US12850595

申请日：2010-08-04

申请人： Willem Gerhardus Johanne Langeveld

发明人： Willem Gerhardus Johanne Langeveld

IPC分类号： G01T1/36

CPC分类号： G01N23/063 ,  G01N23/085 ,  G01N23/087

摘要： The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.

摘要翻译： 该申请公开了用于通过生成预定数量的传输数据样本来确定被扫描的材料的原子序号，确定传输数据样本的方差以及通过比较方差来确定被扫描的材料的原子序号的系统和方法， 将传输数据样本的方差的导数代入一个或多个预定方差。 本申请还公开了通过导出正被扫描的材料的传输信号样本来确定被扫描的材料的原子序号，确定信号样本的方差，以及通过比较方差来确定被扫描的材料的原子序数来确定被扫描材料的​​原子序号的系统和方法 信号样本或方差的导数代表一个或多个预定方差。

公开(公告)号：US4612660A

公开(公告)日：1986-09-16

申请号：US734986

申请日：1985-05-17

申请人： Huey W. Huang

发明人： Huey W. Huang

IPC分类号： G01N23/06 ,  G01N23/223

CPC分类号： G01N23/063

摘要： The present invention relates to an X-ray spectrometer for obtaining EXAFS data from a target material. The target material is exposed to incident pulsed synchrotron/X-ray radiation having a selected range of continuous spectrum and intensity suitable for obtaining EXAFS data from the material. The transmitted or fluorescence X-rays is detected and integrated over a period of time. The integrator is controlled by a gate synchronous with the pulsed radiation. The integration time of the integrator can be varied. A xenon flash is provided for exciting appropriate materials and is controlled by a gating device which is also synchronized with the radiation pulses.

摘要翻译： 本发明涉及一种用于从目标材料获得EXAFS数据的X射线光谱仪。 目标材料暴露于具有适于从材料获得EXAFS数据的连续光谱和强度的选定范围的入射脉冲同步加速器/ X射线辐射。 在一段时间内检测和积分透射或荧光X射线。 积分器由与脉冲辐射同步的门控制。 积分器的积分时间可以变化。 提供氙气闪光灯用于激发合适的材料，并由与同步辐射脉冲的选通装置控制。

公开(公告)号：US20140341340A1

公开(公告)日：2014-11-20

申请号：US14228340

申请日：2014-03-28

申请人： Rapiscan Systems, Inc.

发明人： Willem G.J. Langeveld

IPC分类号： G01N23/06

CPC分类号： G01N23/063 ,  G01N23/085 ,  G01N23/087

摘要： The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.

摘要翻译： 该申请公开了用于通过生成预定数量的传输数据样本来确定被扫描的材料的原子序号，确定传输数据样本的方差以及通过比较方差来确定被扫描的材料的原子序号的系统和方法， 将传输数据样本的方差的导数代入一个或多个预定方差。 本申请还公开了通过导出正被扫描的材料的传输信号样本来确定被扫描的材料的原子序号，确定信号样本的方差，以及通过比较方差来确定被扫描的材料的原子序数来确定被扫描材料的​​原子序号的系统和方法 信号样本或方差的导数代表一个或多个预定方差。

公开(公告)号：US08724774B2

公开(公告)日：2014-05-13

申请号：US12850595

申请日：2010-08-04

申请人： Willem Gerhardus Johannes Langeveld

发明人： Willem Gerhardus Johannes Langeveld

IPC分类号： G01N23/04

CPC分类号： G01N23/063 ,  G01N23/085 ,  G01N23/087

摘要： The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.

摘要翻译： 该申请公开了用于通过生成预定数量的传输数据样本来确定被扫描的材料的原子序号，确定传输数据样本的方差以及通过比较方差来确定被扫描的材料的原子序号的系统和方法， 将传输数据样本的方差的导数代入一个或多个预定方差。 本申请还公开了通过导出正被扫描的材料的传输信号样本来确定被扫描的材料的原子序号，确定信号样本的方差，以及通过比较方差来确定被扫描的材料的原子序号来确定被扫描材料的​​原子序数的系统和方法 信号样本或方差的导数代表一个或多个预定方差。