Abnormality detection apparatus, abnormality detection system, and learning apparatus, and methods for the same and non-temporary computer-readable medium storing the same

    公开(公告)号:US11989013B2

    公开(公告)日:2024-05-21

    申请号:US17421521

    申请日:2019-01-18

    Inventor: Kosuke Yoshida

    CPC classification number: G05B23/0221 G06F18/2132 G06N3/04

    Abstract: An abnormality detection apparatus (200) includes storage means (210) for storing a learned self-encoder (211) including predetermined number of two or more of elements as input layers, extraction means (220) for extracting a target data group of a predetermined period including data pieces from time series data measured by one or more sensors, the number of the data pieces being the predetermined number, conversion means (230) for converting the target data group into multi-dimensional vector data including the predetermined number of elements, identifying means (240) for identifying a time period in which there may be a cause of an abnormality from the predetermined period based on a difference between output vector data having the predetermined number of elements obtained by inputting the multi-dimensional vector data to the self-encoder (211) and the multi-dimensional vector data, and output means (250) for outputting abnormality detection information including the identified time period.

    MACHINE VISION-BASED AUTOMATIC IDENTIFICATION AND RATING METHOD AND SYSTEM FOR LOW-MAGNIFICATION ACID ETCHING DEFECT

    公开(公告)号:US20240233112A1

    公开(公告)日:2024-07-11

    申请号:US18260408

    申请日:2021-12-29

    Abstract: A machine vision-based automatic identification and rating method and system for a low-magnification acid etching defect. The method is used for automatically identifying and rating a defect of a low-magnification aid etching sample of an steel material or a steel billet or a continuous casting billet after acid etching, and comprises: according to a first preset condition, performing image acquisition on the low-magnification acid etching sample of the steel material to obtain a first image (S101); performing automatic image processing on the first image to obtain a second image (S102); according to a second preset condition, performing image segmentation on the second image to obtain a third image (S103); according to a pre-known defect type, performing defect mode identification on the third image to obtain the distribution data of defect modes in the low-magnification acid etching sample (S104); obtaining the quantitative data of various defect modes in the low-magnification acid etching sample according to the third image and the distribution data of the defect modes in the low-magnification acid etching sample (S105); and performing rating on the defect in the low-magnification acid etching sample according to the quantitative data of the defect modes in the low-magnification acid etching sample (S106).

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