Method and a test setup for measuring large-signal S-parameters
    1.
    发明申请
    Method and a test setup for measuring large-signal S-parameters 有权
    测量大信号S参数的方法和测试设置

    公开(公告)号:US20040257092A1

    公开(公告)日:2004-12-23

    申请号:US10856841

    申请日:2004-06-01

    发明人: Jan Verspecht

    CPC分类号: G01R27/28

    摘要: The values of the parameters of a large-signal S-parameter model of a device-under-test are determined by using a frequency-offset probe-tone method and by measuring and processing the spectral components of the scattered voltage waves with frequencies equal to the fundamental frequency, the fundamental frequency plus the said frequency offset and the fundamental frequency minus the said frequency offset. The resulting large-signal S-parameter model accurately and completely describes the amplifier nonlinear behavior with a large one-tone excitation at the input in a near matched environment at the output.

    摘要翻译: 通过使用频率偏移探测色调方法来确定被测器件的大信号S参数模型的参数值,并且通过测量和处理频率等于的频率的散射电压波的频谱分量来确定 基频,基频加所述频偏和基频减去所述频偏。 所得到的大信号S参数模型准确且完整地描述了在输出处的近匹配环境中的输入处具有大的单音激励的放大器非线性行为。

    System and method for detecting defects in a thin-film-transistor array
    2.
    发明申请
    System and method for detecting defects in a thin-film-transistor array 审中-公开
    用于检测薄膜晶体管阵列中的缺陷的系统和方法

    公开(公告)号:US20040249608A1

    公开(公告)日:2004-12-09

    申请号:US10641151

    申请日:2003-08-15

    发明人: Kyo Young Chung

    IPC分类号: G06F019/00 G01R027/28

    CPC分类号: G09G3/006 H04N17/04

    摘要: A system and method for detecting a defect in a transistor array includes applying a test signal to the array, monitoring pixel voltage along a gate line of the array, and detecting a defect associated with the gate line based on a variation in the pixel voltage during the monitoring step. The defect may be a short between the gate line and a common line of the array. The gate line and common line may be associated with a same pixel element or different pixel elements. The system and method also detect a precise location of the defect based on a rate of change in the variation of the pixel voltage along the gate line. The rate of change may be measured in any one of a variety of ways. For example, the rate of change may be measured as a sudden increase or increase of the pixel voltage or as a change in slope of a pixel voltage profile. Alternatively, the location of the defect may be detected as corresponding to a minimum or maximum value in a pixel voltage profile. The transistor array may be a TFT array or another circuit which includes an array of transistors.

    摘要翻译: 一种用于检测晶体管阵列中的缺陷的系统和方法,包括:向阵列施加测试信号,监测沿着阵列的栅极线的像素电压,以及基于像素电压的变化来检测与栅极线相关的缺陷 监控步骤。 缺陷可能是栅极线和阵列的公共线之间的短路。 栅极线和公共线可以与相同的像素元件或不同的像素元件相关联。 该系统和方法还基于沿着栅极线的像素电压的变化的变化率来检测缺陷的精确位置。 变化率可以以各种方式中的任何一种来测量。 例如,变化率可以被测量为像素电压的突然增加或增加,或像素电压分布的斜率的变化。 或者,可以将像素电压分布中的最小值或最大值相应地检测缺陷的位置。 晶体管阵列可以是TFT阵列或包括晶体管阵列的另一电路。

    Electronic component characteristic measuring device
    3.
    发明申请
    Electronic component characteristic measuring device 有权
    电子元件特征测量装置

    公开(公告)号:US20040217764A1

    公开(公告)日:2004-11-04

    申请号:US10486380

    申请日:2004-02-10

    发明人: Yoshikazu Sasaoka

    IPC分类号: G01R027/28 G01R027/32

    CPC分类号: G01R1/0408 G01R31/022

    摘要: An apparatus for measuring the electrical characteristic of a chip-shaped electronic component having first and second external terminal electrodes at first and second opposing ends thereof includes a holder that holds an electronic component with the first and second external terminal electrodes pointing toward first and second open ends of a receiving cavity. The holder is provided with a shield layer extending between first and second measuring terminals, and the shield layer is electrically connected to a measurement reference potential. The shield layer reduces the stray parasitic capacitance adjacent to the electronic component, and reduces measurement errors resulting from size variations of the electronic component.

    摘要翻译: 一种用于测量在其第一和第二相对端处具有第一和第二外部端子电极的片状电子部件的电气特性的装置,包括保持器,其保持电子部件,其中第一和第二外部端子电极指向第一和第二开路 接收腔的端部。 保持器设置有在第一和第二测量端子之间延伸的屏蔽层,并且屏蔽层电连接到测量参考电位。 屏蔽层减小了与电子部件相邻的杂散寄生电容,并减少了由电子部件的尺寸变化引起的测量误差。

    Product having a sensor and a surface acoustic wave element, as well as a method and arrangement for determining a measurement variable, which corresponds to a reactance, by a sensor
    4.
    发明申请
    Product having a sensor and a surface acoustic wave element, as well as a method and arrangement for determining a measurement variable, which corresponds to a reactance, by a sensor 失效
    具有传感器和表面声波元件的产品,以及用于通过传感器确定对应于电抗的测量变量的方法和装置

    公开(公告)号:US20040159154A1

    公开(公告)日:2004-08-19

    申请号:US10780051

    申请日:2004-02-17

    摘要: The product comprises a sensor (1) via which a measured quantity that corresponds to a reactive resistance can be furnished within a measuring range. The product also comprises a matching network (2) and a surface wave element (3). The sensor (1) is connected to a first reflector (4) of the surface wave element (3) via the matching network (2). The first reflector (4) forms, together with the matching network (2) and the sensor (1), a resonator which, for a value of the measured quantity within the measuring range, has a resonance with regard to a reflection of an acoustic surface wave on the first reflector (4). The invention also relates to a method for determining the measured quantity and to a corresponding system.

    摘要翻译: 产品包括传感器(1),通过该传感器可以在测量范围内提供对应于无功电阻的测量量。 该产品还包括匹配网络(2)和表面波元件(3)。 传感器(1)经由匹配网络(2)连接到表面波元件(3)的第一反射器(4)。 第一反射器(4)与匹配网络(2)和传感器(1)一起形成谐振器,对于测量范围内的测量量的值,相对于声学的反射具有谐振 表面波在第一反射器(4)上。 本发明还涉及一种用于确定测量量的方法和相应的系统。

    Fail analyzer
    5.
    发明申请
    Fail analyzer 审中-公开
    故障分析仪

    公开(公告)号:US20030220759A1

    公开(公告)日:2003-11-27

    申请号:US10297699

    申请日:2003-06-02

    发明人: Takeshi Katayama

    摘要: It is an object of the invention to provide a fail analyzer that can reduce the time and effort required for printing or editing of fail analysis result. A printing item setting section 22 sets the various detailed items, including the resolution of the printer 60 and the like, required for printing. A print data generation section 20 generates print data including a general purpose data format while taking account of the resolution. The print data is sent to the printer 60 and then printed on specified sheet. Alternatively, the print data is output as a file and then stored in an analysis result data storing section 40.

    摘要翻译: 本发明的目的是提供一种故障分析器,其可以减少打印或编辑失败分析结果所需的时间和精力。 打印项目设置部分22设置打印所需的各种详细项目,包括打印机60的分辨率等。 打印数据生成部分20在考虑分辨率的情况下生成包括通用数据格式的打印数据。 打印数据被发送到打印机60,然后打印在指定的纸张上。 或者,打印数据作为文件输出,然后存储在分析结果数据存储部分40中。

    Apparatus and method for determining effect of on-chip noise on signal propagation

    公开(公告)号:US20030204354A1

    公开(公告)日:2003-10-30

    申请号:US10443552

    申请日:2003-05-22

    发明人: William E. Corr

    摘要: The invention relates to an integrated circuit testing apparatus having a first test circuit producing a signal for determining at least one of an operating reference signal and a substrate coupling effect on a plurality of components within the integrated circuit; a second test circuit producing a signal for determining at least one of a cross-talk effect on the plurality of components and the accuracy of an interconnect capacitance extraction value; a third test circuit producing a signal for determining at least one of an effect of system noise on the operational speed of the plurality of components and a maximum degradation expected for a logic path between the plurality of components; and a fourth test circuit producing a signal for determining an effect of power supply noise on a signal propagation delay within the plurality of components. Methods of operating such a testing apparatus are also disclosed.

    Position and electromagnetic field sensor
    7.
    发明申请
    Position and electromagnetic field sensor 有权
    位置和电磁场传感器

    公开(公告)号:US20030179000A1

    公开(公告)日:2003-09-25

    申请号:US10221543

    申请日:2003-01-16

    IPC分类号: G01R027/28

    摘要: A position and electromagnetic field sensor is provided. The sensor relies upon an oscillator such as a Robinson marginal oscillator to generate an rf or microwave electromagnetic field. As an inhomogeneously shaped object, such as a metallic toothed wheel, for example, moves through the resultant field, the field experiences a change in electric or magnetic susceptibility. This in turn causes energy losses in the oscillator the magnitude of which can be output as a d.c. signal related thereto. To detect non-moving objects which nevertheless generate an electromagnetic field or have attached to them a source thereof, the sensor also includes a giant or colossal magnetoresistive structure located adjacent the oscillator coil, the structure having an imaginary magnetic susceptibility which is strongly dependent upon the magnitude and direction of the field generated by or at the object to be sensed.

    摘要翻译: 提供了位置和电磁场传感器。 传感器依靠诸如罗宾逊边缘振荡器的振荡器来产生射频或微波电磁场。 作为非均匀形状的物体,例如金属齿轮,例如移动通过合成的场,则该场经历电磁化或磁化率的变化。 这反过来又引起振荡器的能量损失,其幅度可以直接输出。 信号相关。 为了检测仍然产生电磁场或附着于其源的非移动物体,传感器还包括位于振荡器线圈附近的巨大或巨大的磁阻结构,该结构具有假想的磁化率,其强烈依赖于 由待检测物体或由待检测物体产生的场的大小和方向。

    Moisture meter
    8.
    发明申请
    Moisture meter 有权
    水分计

    公开(公告)号:US20030169054A1

    公开(公告)日:2003-09-11

    申请号:US10173836

    申请日:2002-06-19

    IPC分类号: G01R027/28

    CPC分类号: G01N27/223 G01N33/46

    摘要: A moisture meter (1) has a capacitive sensing circuit (11-16) feeding into a digital control circuit having a microcontroller (17). Input buttons (20, 22, 23) allow a user to select a material being surveyed. They also allow the user to instruct the meter (1) to hold a particular reading. This allows it to be more conveniently read. The output of the digital control circuit is fed via an ADC (18) to a moving coil meter (4). This provides an easy-to-read display in which trends as the meter (1) is moved across a surface are easy to track.

    摘要翻译: 水分计(1)具有供给具有微控制器(17)的数字控制电路的电容感测电路(11-16)。 输入按钮(20,22,23)允许用户选择被调查的材料。 它们还允许用户指示仪表(1)保持特定的读数。 这样可以更方便地阅读。 数字控制电路的输出经由ADC(18)馈送到运动线圈仪表(4)。 这提供了一个易于阅读的显示,其中仪表(1)在表面上移动的趋势易于跟踪。

    Inductive proximity sensor
    9.
    发明申请
    Inductive proximity sensor 有权
    感应式接近传感器

    公开(公告)号:US20030071638A1

    公开(公告)日:2003-04-17

    申请号:US10238023

    申请日:2002-09-06

    申请人: Sick AG

    发明人: Olaf Machul

    IPC分类号: G01R027/28

    CPC分类号: H03K17/9542

    摘要: An inductive proximity sensor has an oscillatory circuit (L, C, Rp), an electric energy source (11) coupled to the oscillatory circuit for compensating losses in the circuit, and a filter (15) for compensating signal changes encountered in the oscillatory circuit. The input of the filter is coupled to the oscillatory circuit and its output is coupled and sending output signals to the energy source. The energy source changes the energy or current supplied to the oscillatory circuit as a function of the output signals from the filter to thereby actively compensate for signal changes encountered in the oscillatory circuit.

    摘要翻译: 电感式接近传感器具有振荡电路(L,C,Rp),耦合到振荡电路的电能源(11),用于补偿电路中的损耗;以及滤波器(15),用于补偿振荡电路中遇到的信号变化 。 滤波器的输入耦合到振荡电路,并且其输出耦合并将输出信号发送到能量源。 能量源根据来自滤波器的输出信号改变提供给振荡电路的能量或电流,从而主动地补偿在振荡电路中遇到的信号变化。

    AC defect detection and failure avoidance power up and diagnostic system
    10.
    发明申请
    AC defect detection and failure avoidance power up and diagnostic system 有权
    交流缺陷检测和故障避免上电及诊断系统

    公开(公告)号:US20030065484A1

    公开(公告)日:2003-04-03

    申请号:US09967550

    申请日:2001-09-28

    CPC分类号: G01R19/2513

    摘要: A system for modifying the power up and diagnostic procedure of systems such that the system voltage is lowered to a predetermined voltage level that has been shown to detect delay faults. The system conducts the normal procedure of power up/diagnostic routines at the described VLV condition and then logs failures to this VLV condition. Upon completion of the VLV power up, the system is shut down normally and then subsequently powered up again at the normal voltage conditions. Discrepancies between the VLV power up/diagnostics are noted in the system log and communicated appropriately.

    摘要翻译: 一种用于修改系统的上电和诊断过程的系统,使得系统电压降低到已经显示为检测延迟故障的预定电压电平。 系统在上述VLV条件下执行上电/诊断例程的正常程序,然后将故障记录到该VLV条件。 在VLV上电完成后,系统正常关闭,然后在正常电压条件下再次上电。 在系统日志中记录VLV上电/诊断之间的差异并进行适当的通信。