System and method of integrated circuit self-testing of circuit board connectors
    1.
    发明授权
    System and method of integrated circuit self-testing of circuit board connectors 失效
    电路板连接器的集成电路自检系统和方法

    公开(公告)号:US06420878B1

    公开(公告)日:2002-07-16

    申请号:US09438443

    申请日:1999-11-12

    CPC classification number: G01R1/07342 G01R1/0735

    Abstract: An integrated circuit self-testing system that includes an integrated circuit connected to a circuit board. The integrated circuit includes an output. A connector is attached to the circuit board. A conductive trace of the circuit board electrically connects the output of the integrated circuit to the connector. The conductive trace includes a first section extending between the output of the integrated circuit and the connector of the circuit board, and a second section extending beyond the connector. The integrated circuit includes a pulse generator, that generates a pulsed voltage potential at the output. The integrated circuit further includes a pulse transient detector that detects transients in the voltage potential of the output due to a reflected pulse voltage potential received at the output, thereby indicating whether the connector is properly connected to the conductive trace.

    Abstract translation: 一种集成电路自检系统,其包括连接到电路板的集成电路。 集成电路包括输出。 连接器连接到电路板。 电路板的导电迹线将集成电路的输出电连接到连接器。 导电迹线包括在集成电路的输出和电路板的连接器之间延伸的第一部分和延伸超过连接器的第二部分。 集成电路包括在输出端产生脉冲电压电位的脉冲发生器。 集成电路还包括脉冲瞬态检测器,其检测由于在输出处接收到的反射脉冲电压电位而导致的输出电位电压的瞬态,从而指示连接器是否正确连接到导电迹线。

    Method and device for measuring a line attenuation
    2.
    发明授权
    Method and device for measuring a line attenuation 有权
    用于测量线路衰减的方法和装置

    公开(公告)号:US06781386B2

    公开(公告)日:2004-08-24

    申请号:US10344145

    申请日:2003-02-10

    Inventor: Didier Le Henaff

    CPC classification number: G01R27/06 H04B3/48

    Abstract: Accordingly, the invention relates to a process and a device for measuring the attenuation of a line where the measurement process according to the invention makes it possible to measure the attenuation of a line at a given frequency F and includes at least the steps wherein the emission of an electric signal at one end of the electric line, provides a signal that includes a spectral amplitude A1 at the frequency F; the measurement of the signal reflected by the other end of the line, at the end of the line from where the signal was emitted; the determination of the amplitude A2 of the spectral component at the frequency F of the reflected signal; the determination of the attenuation of the line from the ratio of the amplitude A2 to the amplitude A1 where it applies in particular to the rating of asymmetric digital subscriber lines.

    Abstract translation: 因此,本发明涉及用于测量线的衰减的方法和装置,其中根据本发明的测量过程使得可以测量在给定频率F处的线的衰减,并且至少包括以下步骤:其中发射 在电线的一端处的电信号提供包括频率F的频谱振幅A1的信号; 由线的另一端反射的信号在信号发射线的末端的测量; 确定反射信号的频率F处的频谱分量的振幅A2; 从幅度A2与振幅A1的比值确定线路的衰减,其中特别地适用于非对称数字用户线路的额定值。

    System and method for providing a time varying gain TDR to display abnormalities of a communication cable or the like

    公开(公告)号:US06653844B2

    公开(公告)日:2003-11-25

    申请号:US09916379

    申请日:2001-07-27

    Applicant: Paul Wyar

    Inventor: Paul Wyar

    CPC classification number: G01R31/11 H04L43/50 H04Q2213/1316

    Abstract: In a system and method for testing and displaying the abnormalities, includes opens, shorts, bridged-taps and wet sections, of a copper pair line for xDSL service use, the abnormalities are amplified and normalized so as to be displayed within a predetermined observation range. The normalization steps include piecewise gaining and biasing the reflected pulse of various gains to create a first normalized reflected trace which match the reflected traces within a predetermined observation range and thereby constitute a total smooth curve; and amplifying the first normalized reflected trace according to a function of time to create a second normalized reflected trace so as to eliminate an exponential gain decay curve of a no-fault copper pair line with the same predetermined characteristic parameters from the first normalized reflected trace to thereby obtain a second normalized reflected trace showing any amplified abnormalities.

    Test structure apparatus and method
    4.
    发明授权
    Test structure apparatus and method 失效
    测试结构设备及方法

    公开(公告)号:US06501278B1

    公开(公告)日:2002-12-31

    申请号:US09896861

    申请日:2001-06-29

    Applicant: Ahmad R. Arabi

    Inventor: Ahmad R. Arabi

    CPC classification number: G01R31/11 G01R31/2801

    Abstract: Test structure circuitry and apparatus, circuit boards, and testing systems are described, as well as methods to form such apparatus and circuit boards. The test structure apparatus is used for launching high frequency signals from a test instrument, such as a Time Domain Reflectometer (TDR), into circuitry under test, and includes a pair of launching conductors and a ground pad formed on the first surface of a substrate, or dielectric layer. A ground plane layer, formed on the second surface of the dielectric layer, is connected to the ground pad, which is typically formed so as to substantially surround some portion of the launching conductors. The test structure provides a matching impedance between the TDR probe tip, for example, and the circuit board or components under test.

    Abstract translation: 描述了测试结构电路和装置,电路板和测试系统,以及形成这种装置和电路板的方法。 测试结构设备用于将诸如时域反射计(TDR)的测试仪器的高频信号发射到被测电路,并且包括一对发射导体和形成在衬底的第一表面上的接地焊盘 ,或介电层。 形成在电介质层的第二表面上的接地平面层连接到接地焊盘,接地焊盘通常形成为基本上围绕发射导体的一部分。 测试结构提供了例如TDR探针尖端与被测电路板或组件之间的匹配阻抗。

    Method and system for analyzing cable faults
    5.
    发明授权
    Method and system for analyzing cable faults 有权
    分析电缆故障的方法和系统

    公开(公告)号:US06448781B1

    公开(公告)日:2002-09-10

    申请号:US09684235

    申请日:2000-10-06

    CPC classification number: G01R31/083

    Abstract: A method for analyzing cable faults includes dividing a waveform into a plurality of segments. The waveform is representative of a reflected signal created by applying a stimulus signal to a cable, and the slope at any point on each respective segment of the waveform falls within a respective specified range. The method further includes determining a longest segment from the plurality of segments, and identifying a predicted location of the fault based, at least in part, on the location of the longest segment.

    Abstract translation: 用于分析电缆故障的方法包括将波形划分成多个段。 波形表示通过对电缆施加刺激信号而产生的反射信号,并且波形的每个相应段上的任何点的斜率落在相应的指定范围内。 该方法还包括从多个段确定最长段,以及至少部分地基于最长段的位置来识别故障的预测位置。

    Wire insulation defect detector
    6.
    发明授权
    Wire insulation defect detector 失效
    电线绝缘缺陷探测器

    公开(公告)号:US06677761B1

    公开(公告)日:2004-01-13

    申请号:US10023276

    申请日:2001-12-12

    Inventor: Owen R. Greulich

    CPC classification number: G01R31/11 G01R31/1272

    Abstract: Wiring defects are located by detecting a reflected signal that is developed when an arc occurs through the defect to a nearby ground. The time between the generation of the signal and the return of the reflected signal provides an indication of the distance of the arc (and therefore the defect) from the signal source. To ensure arcing, a signal is repeated at gradually increasing voltages while the wire being tested and a nearby ground are immersed in a conductive medium. In order to ensure that the arcing occurs at an identifiable time, the signal whose reflection is to be detected is always made to reach the highest potential yet seen by the system.

    Abstract translation: 通过检测当通过缺陷发生电弧到附近地面时产生的反射信号来定位接线缺陷。 信号的产生和反射信号的返回之间的时间提供了电弧距离信号源(以及因此的缺陷)的指示。 为了确保电弧放电,在被测试的电线和附近的地面浸入导电介质中时,以逐渐增加的电压重复信号。 为了确保电弧在可识别的时间内发生,反射信号的检测总是达到系统尚未见到的最高的潜力。

    Method and system for performing time domain reflectometry contemporaneously with recurrent transmissions on computer network
    7.
    发明授权
    Method and system for performing time domain reflectometry contemporaneously with recurrent transmissions on computer network 有权
    用于在计算机网络上同时进行时域反射测量的方法和系统

    公开(公告)号:US06657437B1

    公开(公告)日:2003-12-02

    申请号:US09440293

    申请日:1999-11-15

    CPC classification number: H04L43/50 G01R31/086

    Abstract: A method for performing time domain reflectometry contemporaneously with recurrent transmissions, such as idle transmissions, on a computer network, such as a 100 BASE T protocol network is disclosed. This method comprises detecting the recurrent transmissions and then storing representations of those transmissions. A probe signal, such as a TDR signal, is then generated onto the computer network during the recurrent transmissions. A response of the network to the probe signal combined with the recurrent transmissions is then detected. The signal transmission characteristics of the network are then analyzable based on the response to the probe signal using the stored representations of the recurrent transmissions, using deconvolution, for example.

    Abstract translation: 公开了一种用于在诸如100BASE T协议网络的计算机网络上执行与诸如空闲传输之类的诸如空闲传输同时进行时域反射测量的方法。 该方法包括检测复现传输,然后存储那些传输的表示。 然后,在反复传输期间,将诸如TDR信号的探测信号产生到计算机网络上。 然后检测到网络对探测信号与复现传输结合的响应。 然后,使用例如使用去卷积的复现传输的存储表示,可以基于对探测信号的响应来对网络的信号传输特性进行分析。

    Single ended measurement method and system for determining subscriber loop make up
    8.
    发明授权
    Single ended measurement method and system for determining subscriber loop make up 有权
    用于确定用户环路组合的单端测量方法和系统

    公开(公告)号:US06538451B1

    公开(公告)日:2003-03-25

    申请号:US09587459

    申请日:2000-06-05

    Abstract: A method and system for determining the make-up of a subscriber loop having sending pulses onto a loop and acquiring data based on received echo signals. Determining from the received echoes each discontinuity on the loop and, based on each discontinuity, determining a channel transfer function for each loop section preceding the discontinuity. The transfer function is then used to synthesize an inverse filter. The inverse filter and acquired data are convolved for all the loop sections preceding the discontinuity. The method may be further improved by modeling real and spurious echoes and subtracting these echoes from the echoes generated in the loop.

    Abstract translation: 一种用于确定用户环路的组合的方法和系统,包括将脉冲发送到环路上并且基于接收到的回波信号来获取数据。 从接收到的回波确定环路上的每个不连续性,并且基于每个不连续性,确定不连续性之前的每个环路部分的信道传递函数。 然后传递函数用于合成逆滤波器。 反向滤波器和获取的数据被卷积在不连续之前的所有环路部分。 可以通过对实际回声和假回声进行建模并从循环中产生的回波减去这些回波来进一步改善该方法。

    Method and device for the electrical monitoring of an electrode lead of a bipolar high-voltage D.C. transmission system
    9.
    发明授权
    Method and device for the electrical monitoring of an electrode lead of a bipolar high-voltage D.C. transmission system 有权
    用于双极高压直流输电系统的电极引线的电监测的方法和装置

    公开(公告)号:US06518769B1

    公开(公告)日:2003-02-11

    申请号:US09674336

    申请日:2001-02-09

    CPC classification number: G01R31/11 G01R27/18 G01R31/025

    Abstract: To monitor an electrode lead composed of two lines in a bipolar HVDCT system, a balanced-to-ground pulse formed from an unbalanced-to-ground pulse in push/pull mode is fed into the lines and an actual echo curve is recorded from the echo signals and compared to a dynamic target echo curve, a fault signal being generated when a tolerance band placed around the echo difference curve is exceeded. In this way, a monitoring method is achieved which is nearly independent of the sharply fluctuating ground conductance, which has a higher range with simultaneously lower dispersion of the echo, which radiates less electromagnetic energy and which requires no additional decoupling elements.

    Abstract translation: 为了在双极型HVDCT系统中监视由两条线组成的电极引线,将由推/拉模式的不平衡对地脉冲形成的平衡对地脉冲馈送到线路中,并从 回波信号并与动态目标回波曲线进行比较,当超过回波差分曲线周围的公差带时,产生故障信号。 以这种方式,实现了几乎独立于急剧波动的地面电导的监测方法,其具有较高的范围,同时具有更低的回波离散度,其辐射较少的电磁能量,并且不需要额外的去耦元件。

    In-situ method for measuring the endpoint of a resist recess etch process
    10.
    发明授权
    In-situ method for measuring the endpoint of a resist recess etch process 失效
    用于测量抗蚀剂凹陷蚀刻工艺的端点的原位方法

    公开(公告)号:US06486675B1

    公开(公告)日:2002-11-26

    申请号:US09676871

    申请日:2000-09-29

    CPC classification number: G01B11/0683

    Abstract: An in-situ method for measuring the endpoint of a resist recess etch process for DRAM trench cell capacitors to determine the buried plate depth on a semiconductor wafer thereof, including: placing an IR device on the etch chamber; illuminating the surface of a semiconductor wafer during etching to a resist recess depth with IR radiation from the IR device; detecting reflection spectra from the illuminated surface of the semiconductor wafer with an IR detector; performing a frequency analysis of the reflection spectra and providing a corresponding plurality of wave numbers in response thereto; and utilizing calculating device coupled to the IR detector to calculate the resist recess depth at the illuminated portion of the wafer from the plurality of wave numbers corresponding to the reflection spectra.

    Abstract translation: 一种用于测量DRAM沟槽单元电容器的抗蚀剂凹陷蚀刻工艺的端点以确定其半导体晶片上的掩埋板深度的原位方法,包括:将IR器件放置在蚀刻室上; 在IR器件的IR辐射下,将半导体晶片的表面照射到抗蚀剂凹陷深度处; 用IR检测器检测来自半导体晶片的照射表面的反射光谱; 执行反射光谱的频率分析并响应于此提供对应的多个波数; 以及利用耦合到所述IR检测器的计算装置,从对应于所述反射光谱的所述多个波数来计算所述晶片的被照射部分处的抗蚀剂凹陷深度。

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